Shuusuke Kantake

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Delay circuit and test apparatus using delay element and buffer
- Patent number 7,382,117
- Issue date Jun 3, 2008
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Device for testing LSI to be measured, jitter analyzer, and phase d...
- Patent number 7,107,166
- Issue date Sep 12, 2006
- Advantest Corp.
- Shuusuke Kantake
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Delay circuit and test apparatus
- Publication number 20080258714
- Publication date Oct 23, 2008
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Delay circuit and test apparatus
- Publication number 20060284662
- Publication date Dec 21, 2006
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Device for testing lsi to be measured, jitter analyzer, and phase d...
- Publication number 20050080580
- Publication date Apr 14, 2005
- Shuusuke Kantake
- H04 - ELECTRIC COMMUNICATION TECHNIQUE