Shyan-I Wu

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Taipei, TW

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus, system and method for testing electronic elements
- Patent number 8,130,006
- Issue date Mar 6, 2012
- Vishay General Semiconductor, Inc.
- Kuang-Jung Li
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, system and method for testing electronic elements
- Patent number 7,671,611
- Issue date Mar 2, 2010
- Vishay General Semiconductor LLC
- Kuang-Jung Li
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, system and method for testing electronic elements
- Patent number 7,374,293
- Issue date May 20, 2008
- Vishay General Semiconductor Inc.
- Kuang-Jung Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS, SYSTEM AND METHOD FOR TESTING ELECTRONIC ELEMENTS
- Publication number 20100109692
- Publication date May 6, 2010
- Vishay General Semiconductor, Inc.
- Kuang-Jung LI
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, system and method for testing electronic elements
- Publication number 20080136431
- Publication date Jun 12, 2008
- Vishay General Semiconductor, Inc.
- Kuang-Jung Li
- G01 - MEASURING TESTING