Si-Han ZENG

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining root causes of events of a semiconductor man...
- Patent number 11,796,978
- Issue date Oct 24, 2023
- ASML Netherlands B.V.
- Chang-Wei Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for determining overlay
- Patent number 11,774,869
- Issue date Oct 3, 2023
- ASML Netherlands B.V.
- Ruud Hendrikus Martinus Johannes Bloks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SETUP AND CONTROL METHODS FOR A LITHOGRAPHIC PROCESS AND ASSOCIATED...
- Publication number 20250237965
- Publication date Jul 24, 2025
- ASML NETHERLANDS B.V.
- Marc HAUPTMANN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
A METHOD AND SYSTEM FOR DETERMINING OVERLAY
- Publication number 20220171299
- Publication date Jun 2, 2022
- ASML NETHERLANDS B.V.
- Ruud Hendrikus Martinus Johannes BLOKS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DETERMINING ROOT CAUSES OF EVENTS OF A SEMICONDUCTOR MAN...
- Publication number 20210397152
- Publication date Dec 23, 2021
- ASML NETHERLANDS B.V.
- Chang-Wei CHEN
- G05 - CONTROLLING REGULATING