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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe having micro-tip, method and apparatus for manufactu...
- Patent number 11,579,169
- Issue date Feb 14, 2023
- National Institute of Metrology, China
- Zhen-Dong Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Tip-enhanced Raman spectroscope system
- Patent number 11,268,978
- Issue date Mar 8, 2022
- National Institute of Metrology, China
- Zhen-Dong Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe having micro-tip, method and apparatus for manufactu...
- Patent number 11,156,636
- Issue date Oct 26, 2021
- National Institute of Metrology, China
- Zhen-Dong Zhu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TIP-ENHANCED RAMAN SPECTROSCOPE SYSTEM
- Publication number 20220128596
- Publication date Apr 28, 2022
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- ZHEN-DONG ZHU
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE HAVING MICRO-TIP, METHOD AND APPARATUS FOR MANUFACTU...
- Publication number 20220003799
- Publication date Jan 6, 2022
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- ZHEN-DONG ZHU
- G01 - MEASURING TESTING
Information Patent Application
TIP-ENHANCED RAMAN SPECTROSCOPE SYSTEM
- Publication number 20200103279
- Publication date Apr 2, 2020
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- ZHEN-DONG ZHU
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE HAVING MICRO-TIP, METHOD AND APPARATUS FOR MANUFACTU...
- Publication number 20200103438
- Publication date Apr 2, 2020
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- ZHEN-DONG ZHU
- G01 - MEASURING TESTING