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Patents Grants
last 30 patents
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Patent Grant
Methods of controlling the operation of probe stations and probe st...
Patent number
11,016,121
Issue date
May 25, 2021
FormFactor, Inc.
Sia Choon Beng
G01 - MEASURING TESTING
Information
Patent Grant
Probe systems and methods including electric contact detection
Patent number
10,330,703
Issue date
Jun 25, 2019
FormFactor Beaverton, Inc.
Sia Choon Beng
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MICROSCOPES WITH OBJECTIVE ASSEMBLY CRASH DETECTION AND METHODS OF...
Publication number
20200241278
Publication date
Jul 30, 2020
FormFactor Beaverton, Inc.
Gerald Lee Gisler
G02 - OPTICS
Information
Patent Application
PROBE STATIONS FOR TESTING A DEVICE UNDER TEST AND ASSOCIATED METHODS
Publication number
20190369141
Publication date
Dec 5, 2019
FormFactor Beaverton, Inc.
Sia Choon Beng
G01 - MEASURING TESTING
Information
Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION
Publication number
20190277885
Publication date
Sep 12, 2019
FormFactor Beaverton, Inc.
Sia Choon Beng
G01 - MEASURING TESTING
Information
Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION
Publication number
20180284155
Publication date
Oct 4, 2018
Cascade Microtech, Inc.
Sia Choon Beng
G01 - MEASURING TESTING