Sichao LI

Person

ZHUHAI CITY, CN

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for measuring intermittent operating life of GaN-...
- Patent number 12,038,469
- Issue date Jul 16, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Chang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring high electron mobility transistor
- Patent number 11,747,389
- Issue date Sep 5, 2023
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Yulin Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring dynamic on-resistance of GaN-bas...
- Patent number 11,747,390
- Issue date Sep 5, 2023
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Rong Yang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE...
- Publication number 20240213197
- Publication date Jun 27, 2024
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Haohua MA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20240105587
- Publication date Mar 28, 2024
- INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
- Hui YAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR OPERATING THE SAME
- Publication number 20240096726
- Publication date Mar 21, 2024
- INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
- Haohua MA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NITRIDE-BASED SEMICONDUCTOR IC CHIP AND METHOD FOR MANUFACTURING TH...
- Publication number 20240047451
- Publication date Feb 8, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Hui YAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NITRIDE-BASED MULTI-CHANNEL SWITCHING SEMICONDUCTOR DEVICE AND METH...
- Publication number 20230352487
- Publication date Nov 2, 2023
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Hui YAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR MEASURING INTERMITTENT OPERATING LIFE OF GaN-...
- Publication number 20220381815
- Publication date Dec 1, 2022
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Chang CHEN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING DYNAMIC ON-RESISTANCE OF GaN-BAS...
- Publication number 20220373590
- Publication date Nov 24, 2022
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Rong YANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING HIGH ELECTRON MOBILITY TRANSISTOR
- Publication number 20210132137
- Publication date May 6, 2021
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Yulin CHEN
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

System and method for measuring intermittent operating life of GaN-...

Device and method for measuring high electron mobility transistor

Apparatus and method for measuring dynamic on-resistance of GaN-bas...

Patents Applicationslast 30 patents

NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR OPERATING THE SAME

NITRIDE-BASED SEMICONDUCTOR IC CHIP AND METHOD FOR MANUFACTURING TH...

NITRIDE-BASED MULTI-CHANNEL SWITCHING SEMICONDUCTOR DEVICE AND METH...

SYSTEM AND METHOD FOR MEASURING INTERMITTENT OPERATING LIFE OF GaN-...

APPARATUS AND METHOD FOR MEASURING DYNAMIC ON-RESISTANCE OF GaN-BAS...

DEVICE AND METHOD FOR MEASURING HIGH ELECTRON MOBILITY TRANSISTOR