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ZHUHAI CITY, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Nitride-based multi-channel switching semiconductor device and meth...
Patent number
12,159,871
Issue date
Dec 3, 2024
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
Hui Yan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for measuring intermittent operating life of GaN-...
Patent number
12,038,469
Issue date
Jul 16, 2024
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
Chang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring high electron mobility transistor
Patent number
11,747,389
Issue date
Sep 5, 2023
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
Yulin Chen
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring dynamic on-resistance of GaN-bas...
Patent number
11,747,390
Issue date
Sep 5, 2023
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
Rong Yang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE...
Publication number
20240213197
Publication date
Jun 27, 2024
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
Haohua MA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20240105587
Publication date
Mar 28, 2024
INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
Hui YAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR OPERATING THE SAME
Publication number
20240096726
Publication date
Mar 21, 2024
INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
Haohua MA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NITRIDE-BASED SEMICONDUCTOR IC CHIP AND METHOD FOR MANUFACTURING TH...
Publication number
20240047451
Publication date
Feb 8, 2024
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
Hui YAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NITRIDE-BASED MULTI-CHANNEL SWITCHING SEMICONDUCTOR DEVICE AND METH...
Publication number
20230352487
Publication date
Nov 2, 2023
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
Hui YAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR MEASURING INTERMITTENT OPERATING LIFE OF GaN-...
Publication number
20220381815
Publication date
Dec 1, 2022
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
Chang CHEN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING DYNAMIC ON-RESISTANCE OF GaN-BAS...
Publication number
20220373590
Publication date
Nov 24, 2022
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
Rong YANG
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING HIGH ELECTRON MOBILITY TRANSISTOR
Publication number
20210132137
Publication date
May 6, 2021
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
Yulin CHEN
H01 - BASIC ELECTRIC ELEMENTS