Siddharth Sawe

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Event based test method for debugging timing related failures in in...
- Patent number 7,194,668
- Issue date Mar 20, 2007
- Advantest Corp.
- Ankan Pramanick
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Event based test method for debugging timing related failures in in...
- Publication number 20040216005
- Publication date Oct 28, 2004
- Ankan Pramanick
- G01 - MEASURING TESTING