Membership
Tour
Register
Log in
Sidi Yomtov
Follow
Person
Nex-Ziona, IL
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Testability method for modularized integrated circuits
Patent number
6,060,897
Issue date
May 9, 2000
National Semiconductor Corporation
Alon Shacham
G01 - MEASURING TESTING
Information
Patent Grant
Integrated data processing system including CPU core and parallel,...
Patent number
5,592,677
Issue date
Jan 7, 1997
National Semiconductor Corporation
Amos Intrater
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated CPU core and parallel, independently operating DSP modul...
Patent number
5,590,357
Issue date
Dec 31, 1996
National Semiconductor Corporation
Amos Intrater
G06 - COMPUTING CALCULATING COUNTING