TREA

Siegfried Tomaschko

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  • Boeblingen, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Wafer probe alignment
    • Patent number 9,977,053
    • Issue date May 22, 2018
    • International Business Machines Corporation
    • Joerg G. Appinger
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer probe alignment
    • Patent number 9,927,463
    • Issue date Mar 27, 2018
    • International Business Machines Corporation
    • Joerg G. Appinger
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Auto-alignment of backer plate for direct docking test boards
    • Patent number 9,921,268
    • Issue date Mar 20, 2018
    • International Business Machines Corporation
    • Eberhard Dengler
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTO-ALIGNMENT OF BACKER PLATE FOR DIRECT DOCKING TEST BOARDS
    • Publication number 20170139003
    • Publication date May 18, 2017
    • International Business Machines Corporation
    • Eberhard Dengler
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER PROBE ALIGNMENT
    • Publication number 20170108547
    • Publication date Apr 20, 2017
    • International Business Machines Corporation
    • Joerg G. APPINGER
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER PROBE ALIGNMENT
    • Publication number 20170108534
    • Publication date Apr 20, 2017
    • International Business Machines Corporation
    • Joerg G. APPINGER
    • G01 - MEASURING TESTING