Sietse Thijmen VAN DER POST

Person

Amsterdam, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Manufacturing a reflective diffraction grating
- Patent number 12,164,125
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Han-Kwang Nienhuys
- G02 - OPTICS
Information Patent Grant
Wavefront sensor and associated metrology apparatus
- Patent number 11,815,402
- Issue date Nov 14, 2023
- ASML Netherlands B.V.
- Sietse Thijmen Van Der Post
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods and apparatus for predicting performance of a measurement m...
- Patent number 11,626,704
- Issue date Apr 11, 2023
- ASML Netherlands B.V.
- Sietse Thijmen Van Der Post
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for deriving corrections, method and apparatus...
- Patent number 11,243,470
- Issue date Feb 8, 2022
- ASML Netherlands B.V.
- Nitish Kumar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical systems, metrology apparatus and associated method
- Patent number 10,725,381
- Issue date Jul 28, 2020
- ASML Netherlands B.V.
- Sietse Thijmen Van Der Post
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of determining a property of a structure, inspection apparat...
- Patent number 10,712,673
- Issue date Jul 14, 2020
- ASML Netherlands B.V.
- Sietse Thijmen Van Der Post
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining alignment properties of a beam...
- Patent number 10,613,448
- Issue date Apr 7, 2020
- ASML Netherlands B.V.
- Sietse Thijmen Van Der Post
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection and metrology
- Patent number 10,578,979
- Issue date Mar 3, 2020
- ASML Netherlands B.V.
- Sietse Thijmen Van Der Post
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of optimizing the position and/or size of a measurement illu...
- Patent number 10,488,765
- Issue date Nov 26, 2019
- ASML Netherlands B.V.
- Johan Maria Van Boxmeer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Illumination source for an inspection apparatus, inspection apparat...
- Patent number 10,451,559
- Issue date Oct 22, 2019
- ASML Netherlands B.V.
- Peter Danny Van Voorst
- G01 - MEASURING TESTING
Information Patent Grant
Illumination source for an inspection apparatus, inspection apparat...
- Patent number 10,330,606
- Issue date Jun 25, 2019
- ASML Netherlands B.V.
- Peter Danny Van Voorst
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for inspection and metrology
- Patent number 10,248,029
- Issue date Apr 2, 2019
- ASML Netherlands B.V.
- Sietse Thijmen Van Der Post
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for inspection and metrology
- Patent number 10,126,659
- Issue date Nov 13, 2018
- ASML Netherlands B.V.
- Ferry Zijp
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection and metrology
- Patent number 9,851,246
- Issue date Dec 26, 2017
- ASML Netherlands B.V.
- Sietse Thijmen Van Der Post
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MEASURING METHOD AND MEASURING APPARATUS
- Publication number 20220397834
- Publication date Dec 15, 2022
- ASML NETHERLANDS B.V.
- Johan REININK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MANUFACTURING A REFLECTIVE DIFFRACTION GRATING
- Publication number 20220221629
- Publication date Jul 14, 2022
- ASML NETHERLANDS B.V.
- Han-Kwang NIENHUYS
- G02 - OPTICS
Information Patent Application
REFLECTOR MANUFACTURING METHOD AND ASSOCIATED REFLECTOR
- Publication number 20220134693
- Publication date May 5, 2022
- ASML NETHERLANDS B.V.
- Sander Bas ROOBOL
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
WAVEFRONT SENSOR AND ASSOCIATED METROLOGY APPARATUS
- Publication number 20220099498
- Publication date Mar 31, 2022
- ASML NETHERLANDS B.V.
- Sietse Thijmen VAN DER POST
- G02 - OPTICS
Information Patent Application
METHOD OF DETERMINING A PROPERTY OF A STRUCTURE, INSPECTION APPARAT...
- Publication number 20190361360
- Publication date Nov 28, 2019
- ASML NETHERLANDS B.V.
- Sietse Thijmen VAN DER POST
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20190212655
- Publication date Jul 11, 2019
- ASML NETHERLANDS B.V.
- Sietse Thijmen VAN DER POST
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR DERIVING CORRECTIONS, METHOD AND APPARATUS...
- Publication number 20190212660
- Publication date Jul 11, 2019
- ASML NETHERLANDS B.V.
- Nitish KUMAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Optimizing the Position and/or Size of a Measurement Illu...
- Publication number 20190107786
- Publication date Apr 11, 2019
- ASML NETHERLANDS B.V.
- Johan Maria VAN BOXMEER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Determining Alignment Properties of a Beam...
- Publication number 20190101840
- Publication date Apr 4, 2019
- ASML NETHERLANDS B.V.
- Sietse Thijmen VAN DER POST
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical Systems, Metrology Apparatus and Associated Method
- Publication number 20190072853
- Publication date Mar 7, 2019
- ASML NETHERLANDS B.V.
- Sietse Thijmen VAN DER POST
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Illumination Source for an Inspection Apparatus, Inspection Apparat...
- Publication number 20190003981
- Publication date Jan 3, 2019
- ASML NETHERLANDS B.V.
- Peter Danny Van Voorst
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods and Apparatus for Predicting Performance of a Measurement M...
- Publication number 20180254597
- Publication date Sep 6, 2018
- ASML NETHERLANDS B.V.
- Sietse Thijmen VAN DER POST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20180188658
- Publication date Jul 5, 2018
- ASML NETHERLANDS B.V.
- Sietse Thijmen VAN DER POST
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Illumination Source for an Inspection Apparatus, Inspection Apparat...
- Publication number 20180073992
- Publication date Mar 15, 2018
- ASML NETHERLANDS B.V.
- Peter Danny VAN VOORST
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20170102620
- Publication date Apr 13, 2017
- ASML NETHERLANDS B.V.
- Ferry ZIJP
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20160258810
- Publication date Sep 8, 2016
- ASML NETHERLANDS B.V.
- Sietse Thijmen VAN DER POST
- G01 - MEASURING TESTING

Sietse Thijmen VAN DER POST

Person

Patents Grantslast 30 patents

Manufacturing a reflective diffraction grating

Wavefront sensor and associated metrology apparatus

Methods and apparatus for predicting performance of a measurement m...

Method and apparatus for deriving corrections, method and apparatus...

Optical systems, metrology apparatus and associated method

Method of determining a property of a structure, inspection apparat...

Method and apparatus for determining alignment properties of a beam...

Method and apparatus for inspection and metrology

Method of optimizing the position and/or size of a measurement illu...

Illumination source for an inspection apparatus, inspection apparat...

Illumination source for an inspection apparatus, inspection apparat...

Method and apparatus for inspection and metrology

Method and apparatus for inspection and metrology

Method and apparatus for inspection and metrology

Patents Applicationslast 30 patents

MEASURING METHOD AND MEASURING APPARATUS

MANUFACTURING A REFLECTIVE DIFFRACTION GRATING

REFLECTOR MANUFACTURING METHOD AND ASSOCIATED REFLECTOR

WAVEFRONT SENSOR AND ASSOCIATED METROLOGY APPARATUS

METHOD OF DETERMINING A PROPERTY OF A STRUCTURE, INSPECTION APPARAT...

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY

METHOD AND APPARATUS FOR DERIVING CORRECTIONS, METHOD AND APPARATUS...

Method of Optimizing the Position and/or Size of a Measurement Illu...

Method and Apparatus for Determining Alignment Properties of a Beam...

Optical Systems, Metrology Apparatus and Associated Method

Illumination Source for an Inspection Apparatus, Inspection Apparat...

Methods and Apparatus for Predicting Performance of a Measurement M...

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY

Illumination Source for an Inspection Apparatus, Inspection Apparat...

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY