Membership
Tour
Register
Log in
Siew Khim Oh
Follow
Person
Singapore, SG
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Planar view TEM sample preparation from circuit layer structures
Patent number
7,208,965
Issue date
Apr 24, 2007
Systems on Silicon Manufacturing Co. Pte. Ltd.
Wen Yi Zhang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Planar view TEM sample preparation from circuit layer structures
Publication number
20060139049
Publication date
Jun 29, 2006
Wen Yi Zhang
G01 - MEASURING TESTING