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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and AC resistance measuring system including t...
Patent number
10,539,600
Issue date
Jan 21, 2020
Renesas Electronics Corporation
Masato Hirai
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device, and resistance measuring system and pressure...
Patent number
10,107,698
Issue date
Oct 23, 2018
Renesas Electronics Corporation
Masato Hirai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE, AND RESISTANCE MEASURING SYSTEM AND PRESSURE...
Publication number
20160097692
Publication date
Apr 7, 2016
RENESAS ELECTRONICS CORPORATION
Masato HIRAI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND AC RESISTANCE MEASURING SYSTEM INCLUDING T...
Publication number
20160091543
Publication date
Mar 31, 2016
RENESAS ELECTRONICS CORPORATION
Masato HIRAI
G01 - MEASURING TESTING