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Sigfredo Emanuel Gonzalez Diaz
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Allen, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
High-side gate over-voltage stress testing
Patent number
11,624,769
Issue date
Apr 11, 2023
Texas Instruments Incorporated
Sigfredo E. Gonzalez Diaz
G01 - MEASURING TESTING
Information
Patent Grant
High-side gate over-voltage stress testing
Patent number
11,353,494
Issue date
Jun 7, 2022
Texas Instruments Incorporated
Sigfredo E. Gonzalez Diaz
G01 - MEASURING TESTING
Information
Patent Grant
Reducing noise effects in electrostatic discharge circuits
Patent number
10,892,756
Issue date
Jan 12, 2021
Texas Instruments Incorporated
Benjamin Lee Arney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-side gate over-voltage stress testing
Patent number
10,613,134
Issue date
Apr 7, 2020
Texas Instruments Incorporated
Sigfredo E. Gonzalez Diaz
G01 - MEASURING TESTING
Information
Patent Grant
Wide common mode range transmission gate
Patent number
8,975,948
Issue date
Mar 10, 2015
Texas Instruments Incorporated
Sigfredo Emanuel Gonzalez Diaz
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
DUAL LOOP VOLTAGE CLAMP
Publication number
20240178756
Publication date
May 30, 2024
TEXAS INSTRUMENTS INCORPORATED
Mustapha EL-MARKHI
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
Publication number
20220260627
Publication date
Aug 18, 2022
TEXAS INSTRUMENTS INCORPORATED
Sigfredo E. Gonzalez Diaz
G01 - MEASURING TESTING
Information
Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
Publication number
20200182925
Publication date
Jun 11, 2020
TEXAS INSTRUMENTS INCORPORATED
Sigfredo E. Gonzalez Diaz
G01 - MEASURING TESTING
Information
Patent Application
REDUCING NOISE EFFECTS IN ELECTROSTATIC DISCHARGE CIRCUITS
Publication number
20190199351
Publication date
Jun 27, 2019
TEXAS INSTRUMENTS INCORPORATED
Benjamin Lee Amey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
Publication number
20180180661
Publication date
Jun 28, 2018
TEXAS INSTRUMENTS INCORPORATED
Sigfredo E. Gonzalez Diaz
G01 - MEASURING TESTING
Information
Patent Application
Wide Common Mode Range Transmission Gate
Publication number
20140132331
Publication date
May 15, 2014
TEXAS INSTRUMENTS INCORPORATED
Sigfredo Emanuel Gonzalez Diaz
H03 - BASIC ELECTRONIC CIRCUITRY