Silviu Velicu

Person

Willowbrook, IL, US

People

Patents Grantslast 30 patents

Information Patent Grant
HgCdTe metasurface-based terahertz source and detector
- Patent number 12,075,701
- Issue date Aug 27, 2024
- EPIR, INC.
- Sushant Sonde
Information Patent Grant
Compact apparatus for high-speed chemical spectral signature measur...
- Patent number 12,007,323
- Issue date Jun 11, 2024
- EPIR, INC.
- Wei Gao
- G01 - MEASURING TESTING
Information Patent Grant
In-situ laser annealing of Te growth defects in CdZnTe (ilast-czt)
- Patent number 11,725,300
- Issue date Aug 15, 2023
- EPIR, INC.
- Sushant Sonde
- C30 - CRYSTAL GROWTH
Information Patent Grant
Modified direct bond interconnect for FPAs
- Patent number 11,670,616
- Issue date Jun 6, 2023
- EPIR, INC.
- Sushant Sonde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact apparatus for high-speed chemical spectral signature measur...
- Patent number 11,506,598
- Issue date Nov 22, 2022
- EPIR, INC.
- Wei Gao
- G01 - MEASURING TESTING
Information Patent Grant
Method for creating nonequilibrium photodetectors with single carri...
- Patent number 8,072,801
- Issue date Dec 6, 2011
- EPIR Technologies, Inc.
- Silviu Velicu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Photodetector with dark current reduction
- Patent number 7,820,971
- Issue date Oct 26, 2010
- EPIR Technologies, Inc.
- Silviu Velicu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonequilibrium photodetectors with single carrier species barriers
- Patent number 7,821,807
- Issue date Oct 26, 2010
- EPIR Technologies, Inc.
- Silviu Velicu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Forming a photodiode to include a superlattice exclusion layer
- Patent number 7,045,378
- Issue date May 16, 2006
- EPIR Technologies, Inc.
- Christoph H. Grein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonequilibrium photodetector with superlattice exclusion layer
- Patent number 6,906,358
- Issue date Jun 14, 2005
- EPIR Technologies, Inc.
- Christoph H. Grein
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
System and method for optical mapping of semiconductor wafers at cr...
- Publication number 20240201105
- Publication date Jun 20, 2024
- Epir, Inc.
- Issac L. Chang
- G01 - MEASURING TESTING
Information Patent Application
Compact Apparatus for High-Speed Chemical Spectral Signature Measur...
- Publication number 20230228675
- Publication date Jul 20, 2023
- Epir, Inc.
- Wei Gao
- G01 - MEASURING TESTING
Information Patent Application
Radiation Hardened Infrared Focal Plane Array
- Publication number 20230008594
- Publication date Jan 12, 2023
- Yong Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
In-situ Laser Annealing of Te growth defects in CdZnTe (iLAST-CZT)
- Publication number 20230002928
- Publication date Jan 5, 2023
- Sushant Sonde
- C30 - CRYSTAL GROWTH
Information Patent Application
HgCdTe Metasurface-based Terahertz Source and Detector
- Publication number 20220231214
- Publication date Jul 21, 2022
- Epir, Inc.
- Sushant Sonde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modified Direct Bond Interconnect for FPAs
- Publication number 20220052020
- Publication date Feb 17, 2022
- Sushant Sonde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact Apparatus for High-Speed Chemical Spectral Signature Measur...
- Publication number 20210164890
- Publication date Jun 3, 2021
- Wei Gao
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CREATING NONEQUILIBRIUM PHOTODETECTORS WITH SINGLE CARRI...
- Publication number 20100233842
- Publication date Sep 16, 2010
- EPIR TECHNOLOGIES, INC.
- Christopher H. GREIN
- B82 - NANO-TECHNOLOGY
Information Patent Application
PHOTODETECTOR WITH DARK CURRENT REDUCTION
- Publication number 20090321642
- Publication date Dec 31, 2009
- EPIR TECHNOLOGIES, INC.
- Silviu VELICU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONEQUILIBRIUM PHOTODETECTORS WITH SINGLE CARRIER SPECIES BARRIERS
- Publication number 20090261442
- Publication date Oct 22, 2009
- EPIR TECHNOLOGIES, INC.
- Christoph H. Grein
- B82 - NANO-TECHNOLOGY
Information Patent Application
Forming a photodiode to include a superlattice exclusion layer
- Publication number 20050040428
- Publication date Feb 24, 2005
- EPIR TECHNOLOGIES, INC.
- Christoph H. Grein
- B82 - NANO-TECHNOLOGY
Information Patent Application
NONEQUILIBRIUM PHOTODETECTOR WITH SUPERLATTICE EXCLUSION LAYER
- Publication number 20040150002
- Publication date Aug 5, 2004
- SMART PIXEL, INC.
- Christoph H. Grein
- B82 - NANO-TECHNOLOGY

Silviu Velicu

Person

Patents Grantslast 30 patents

HgCdTe metasurface-based terahertz source and detector

Compact apparatus for high-speed chemical spectral signature measur...

In-situ laser annealing of Te growth defects in CdZnTe (ilast-czt)

Modified direct bond interconnect for FPAs

Compact apparatus for high-speed chemical spectral signature measur...

Method for creating nonequilibrium photodetectors with single carri...

Photodetector with dark current reduction

Nonequilibrium photodetectors with single carrier species barriers

Forming a photodiode to include a superlattice exclusion layer

Nonequilibrium photodetector with superlattice exclusion layer

Patents Applicationslast 30 patents

System and method for optical mapping of semiconductor wafers at cr...

Compact Apparatus for High-Speed Chemical Spectral Signature Measur...

Radiation Hardened Infrared Focal Plane Array

In-situ Laser Annealing of Te growth defects in CdZnTe (iLAST-CZT)

HgCdTe Metasurface-based Terahertz Source and Detector

Modified Direct Bond Interconnect for FPAs

Compact Apparatus for High-Speed Chemical Spectral Signature Measur...

METHOD FOR CREATING NONEQUILIBRIUM PHOTODETECTORS WITH SINGLE CARRI...

PHOTODETECTOR WITH DARK CURRENT REDUCTION

NONEQUILIBRIUM PHOTODETECTORS WITH SINGLE CARRIER SPECIES BARRIERS

Forming a photodiode to include a superlattice exclusion layer

NONEQUILIBRIUM PHOTODETECTOR WITH SUPERLATTICE EXCLUSION LAYER