Simon D. Bennett

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Los Gatos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for reading or measuring magneto-optical stora...
- Patent number 4,847,823
- Issue date Jul 11, 1989
- SiScan Systems, Inc.
- James T. Lindow
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and aparatus for determining surface profiles
- Patent number 4,748,335
- Issue date May 31, 1988
- SiScan Systems, Inc.
- James T. Lindow
- G02 - OPTICS
Information Patent Grant
Confocal optical imaging system with improved signal-to-noise ratio
- Patent number RE32660
- Issue date May 3, 1988
- SiScan Systems, Inc.
- James T. Lindow
- 250 - Radiant energy
Information Patent Grant
Method and apparatus for measuring surface profiles
- Patent number 4,707,610
- Issue date Nov 17, 1987
- SiScan Systems, Inc.
- James T. Lindow
- G02 - OPTICS
Information Patent Grant
Semiconductor wafer scanning system
- Patent number 4,689,491
- Issue date Aug 25, 1987
- Datasonics Corp.
- James T. Lindow
- G02 - OPTICS
Information Patent Grant
Confocal optical imaging system with improved signal-to-noise ratio
- Patent number 4,634,880
- Issue date Jan 6, 1987
- SiScan Systems, Inc.
- James T. Lindow
- G02 - OPTICS