Simon Diemer

Person

Rottingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for operating a particle beam microscope
- Patent number 11,915,907
- Issue date Feb 27, 2024
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for tracking microscopic samples
- Patent number 11,328,896
- Issue date May 10, 2022
- Carl Zeiss Microscopy GmbH
- Wolfgang Berger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of operating a charged particle microscope and charged parti...
- Patent number 9,916,964
- Issue date Mar 13, 2018
- Carl Zeiss Microscopy GmbH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of adjusting a stigmator in a particle beam apparatus and a...
- Patent number 9,455,115
- Issue date Sep 27, 2016
- Carl Zeiss Microscopy GmbH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a charged particle microscope and charged parti...
- Patent number 9,437,394
- Issue date Sep 6, 2016
- Carl Zeiss Microscopy Ltd.
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam microscope and method for operating the particle beam...
- Patent number 8,487,252
- Issue date Jul 16, 2013
- Carl Zeiss NTS GmbH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND RELATED SYSTEM AND C...
- Publication number 20240047175
- Publication date Feb 8, 2024
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FOCUSING AND OPERATING A PARTICLE BEAM MICROSCOPE
- Publication number 20230078510
- Publication date Mar 16, 2023
- CARL ZEISS MICROSCOPY GMBH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM MICROSCOPE
- Publication number 20220246389
- Publication date Aug 4, 2022
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for determining an image recording aberration
- Publication number 20200311886
- Publication date Oct 1, 2020
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR TRACKING MICROSCOPIC SAMPLES
- Publication number 20190341223
- Publication date Nov 7, 2019
- CARL ZEISS MICROSCOPY GMBH
- Wolfgang Berger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Adjusting a Stigmator in a Particle Beam Apparatus and a...
- Publication number 20160181055
- Publication date Jun 23, 2016
- CARL ZEISS MICROSCOPY GMBH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam Microscope and Method for Operating the Particle Beam...
- Publication number 20120074317
- Publication date Mar 29, 2012
- CARL ZEISS NTS GMBH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS

Simon Diemer

Person

Patents Grantslast 30 patents

Method for operating a particle beam microscope

Device and method for tracking microscopic samples

Method of operating a charged particle microscope and charged parti...

Method of adjusting a stigmator in a particle beam apparatus and a...

Method of operating a charged particle microscope and charged parti...

Particle beam microscope and method for operating the particle beam...

Patents Applicationslast 30 patents

METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND RELATED SYSTEM AND C...

METHOD FOR FOCUSING AND OPERATING A PARTICLE BEAM MICROSCOPE

METHOD FOR OPERATING A PARTICLE BEAM MICROSCOPE

Method for determining an image recording aberration

DEVICE AND METHOD FOR TRACKING MICROSCOPIC SAMPLES

Method of Adjusting a Stigmator in a Particle Beam Apparatus and a...

Particle Beam Microscope and Method for Operating the Particle Beam...