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Simon HOUIS

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  • Neuchatel, CH
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Patents Grantslast 30 patents

  • Information Patent Grant

    Current sensor device
    • Patent number 11,927,606
    • Issue date Mar 12, 2024
    • Melexis Technologies SA
    • Lucian Barbut
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Current sensor system
    • Patent number 11,815,533
    • Issue date Nov 14, 2023
    • Melexis Technologies SA
    • Simon Houis
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Current sensing system
    • Patent number 11,796,572
    • Issue date Oct 24, 2023
    • Melexis Technologies SA
    • Lucian Barbut
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Current sensor system
    • Patent number 11,796,573
    • Issue date Oct 24, 2023
    • Melexis Technologies SA
    • Simon Houis
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Current sensor and method
    • Patent number 11,747,369
    • Issue date Sep 5, 2023
    • Melexis Technologies SA
    • Simon Houis
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Current sensor system
    • Patent number 11,740,263
    • Issue date Aug 29, 2023
    • Melexis Technologies SA
    • Simon Houis
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Current sensor device
    • Patent number 11,531,046
    • Issue date Dec 20, 2022
    • Melexis Technologies SA
    • Lucian Barbut
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Offset current sensor structure
    • Patent number 11,480,590
    • Issue date Oct 25, 2022
    • Melexis Technologies SA
    • Robert Racz
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Offset current sensor structure
    • Patent number 11,480,591
    • Issue date Oct 25, 2022
    • Melexis Technologies SA
    • Javier Bilbao De Mendizabal
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Current sensor with integrated current conductor
    • Patent number 11,035,887
    • Issue date Jun 15, 2021
    • Melexis Technologies SA
    • Javier Bilbao De Mendizabal
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CURRENT SENSOR FOR MULTIPLE CURRENTS
    • Publication number 20240219429
    • Publication date Jul 4, 2024
    • Melexis Technologies SA
    • Simon HOUIS
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING WITH CROSSTALK IMMUNITY
    • Publication number 20240219430
    • Publication date Jul 4, 2024
    • Melexis Technologies SA
    • Simon HOUIS
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR DEVICE
    • Publication number 20240151749
    • Publication date May 9, 2024
    • Melexis Technologies SA
    • Lucian BARBUT
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR SYSTEM
    • Publication number 20240036084
    • Publication date Feb 1, 2024
    • Melexis Technologies SA
    • Simon HOUIS
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSING SYSTEM
    • Publication number 20240003940
    • Publication date Jan 4, 2024
    • Melexis Technologies SA
    • Lucian BARBUT
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    CURRENT SENSOR AND METHOD
    • Publication number 20230358789
    • Publication date Nov 9, 2023
    • Melexis Technologies SA
    • Simon HOUIS
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SUPERVISORY DEVICE
    • Publication number 20230204636
    • Publication date Jun 29, 2023
    • Melexis Technologies SA
    • Bruno BOURY
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSING WITH POSITIONING STABILITY
    • Publication number 20230204632
    • Publication date Jun 29, 2023
    • Melexis Technologies SA
    • Simon HOUIS
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR DEVICE
    • Publication number 20230086851
    • Publication date Mar 23, 2023
    • Melexis Technologies SA
    • Lucian BARBUT
    • G01 - MEASURING TESTING
  • Information Patent Application

    OFFSET CURRENT SENSOR STRUCTURE
    • Publication number 20230084942
    • Publication date Mar 16, 2023
    • Melexis Technologies SA
    • Robert RACZ
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR SYSTEM
    • Publication number 20220341971
    • Publication date Oct 27, 2022
    • Melexis Technologies SA
    • Simon HOUIS
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSING SYSTEM
    • Publication number 20220137100
    • Publication date May 5, 2022
    • Melexis Technologies SA
    • Lucian BARBUT
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR DEVICE
    • Publication number 20220099709
    • Publication date Mar 31, 2022
    • Melexis Technologies SA
    • Lucian BARBUT
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR SYSTEM
    • Publication number 20220091161
    • Publication date Mar 24, 2022
    • Melexis Technologies SA
    • Simon HOUIS
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR AND METHOD
    • Publication number 20220018880
    • Publication date Jan 20, 2022
    • Melexis Technologies SA
    • Simon HOUIS
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR SYSTEM
    • Publication number 20210373050
    • Publication date Dec 2, 2021
    • Melexis Technologies SA
    • Simon HOUIS
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR WITH INTEGRATED CURRENT CONDUCTOR
    • Publication number 20200191835
    • Publication date Jun 18, 2020
    • Melexis Technologies SA
    • Javier BILBAO DE MENDIZABAL
    • G01 - MEASURING TESTING
  • Information Patent Application

    OFFSET CURRENT SENSOR STRUCTURE
    • Publication number 20190212371
    • Publication date Jul 11, 2019
    • Melexis Technologies SA
    • Robert RACZ
    • G01 - MEASURING TESTING
  • Information Patent Application

    OFFSET CURRENT SENSOR STRUCTURE
    • Publication number 20190212372
    • Publication date Jul 11, 2019
    • Melexis Technologies SA
    • Javier BILBAO DE MENDIZABAL
    • G01 - MEASURING TESTING