Simon J. Chandler

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Cambridge, GB

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Patents Grantslast 30 patents

Information Patent Grant
Test system
- Patent number 11,921,154
- Issue date Mar 5, 2024
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Test system for testing the integrity of an electronic device
- Patent number 11,366,158
- Issue date Jun 21, 2022
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
TeraHertz probe array imaging system
- Patent number 9,075,002
- Issue date Jul 7, 2015
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST SYSTEM
- Publication number 20240192270
- Publication date Jun 13, 2024
- Teraview Limited
- Brian Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20220268833
- Publication date Aug 25, 2022
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
A TEST SYSTEM
- Publication number 20180364301
- Publication date Dec 20, 2018
- TERAVIEW LIMITED
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
Terahertz probe array imaging system
- Publication number 20070158571
- Publication date Jul 12, 2007
- Bryan E. Cole
- G01 - MEASURING TESTING