Simon Mieth

Follow

Person

Frankfurt, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring wafers
- Patent number 12,264,914
- Issue date Apr 1, 2025
- Precitec Optronik GmbH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device and method
- Patent number 10,571,249
- Issue date Feb 25, 2020
- PRECITEC OPTRONIK GMBH
- Philipp Nimtsch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR MEASURING WAFERS
- Publication number 20250198743
- Publication date Jun 19, 2025
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Measuring Wafers
- Publication number 20250189299
- Publication date Jun 12, 2025
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
- Publication number 20240393261
- Publication date Nov 28, 2024
- PRECITEC OPTRONIK GMBH
- Tobias Beck
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING WAFERS
- Publication number 20240310159
- Publication date Sep 19, 2024
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING