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Simon Philip Spencer HASTINGS
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Eindhoven, NL
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last 30 patents
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Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
Patent number
11,022,892
Issue date
Jun 1, 2021
ASML Netherlands B.V.
Patrick Warnaar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Metrology method, apparatus and computer program
Patent number
10,598,483
Issue date
Mar 24, 2020
ASML Netherlands B.V.
Sergey Tarabrin
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
Patent number
10,466,594
Issue date
Nov 5, 2019
ASML Netherlands B.V.
Patrick Warnaar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
METHODS USING FINGERPRINT AND EVOLUTION ANALYSIS
Publication number
20210255547
Publication date
Aug 19, 2021
ASML NETHERLANDS B.V.
Jeroen Van Dongen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
Publication number
20200064744
Publication date
Feb 27, 2020
ASML NETHERLANDS B.V.
Patrick WARNAAR
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Metrology Method, Apparatus and Computer Program
Publication number
20180073866
Publication date
Mar 15, 2018
ASML NETHERLANDS B.V.
Sergey Tarabrin
G01 - MEASURING TESTING
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Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
Publication number
20170248852
Publication date
Aug 31, 2017
ASML NETHERLANDS B.V.
Patrick WARNAAR
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY