Simon Siu-Sing Chan

Person

Saratoga, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit system with memory system
- Patent number 8,114,736
- Issue date Feb 14, 2012
- GLOBALFOUNDRIES Inc.
- Simon Siu-Sing Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit eliminating source/drain junction spiking
- Patent number 8,102,009
- Issue date Jan 24, 2012
- Advanced Micro Devices, Inc.
- Simon Siu-Sing Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-silicide system in integrated circuit technology
- Patent number 7,843,015
- Issue date Nov 30, 2010
- GLOBALFOUNDRIES Inc.
- Robert J. Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact liner in integrated circuit technology
- Patent number 7,670,915
- Issue date Mar 2, 2010
- Advanced Micro Devices, Inc.
- Errol Todd Ryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a semiconductor device
- Patent number 7,456,062
- Issue date Nov 25, 2008
- Advanced Micro Devices, Inc.
- William G. En
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selectable open circuit and anti-fuse element
- Patent number 7,250,667
- Issue date Jul 31, 2007
- Advanced Micro Devices, Inc.
- Darin A. Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of eliminating source/drain junction spiking, and device pro...
- Patent number 7,132,352
- Issue date Nov 7, 2006
- Advanced Micro Devices, Inc.
- Simon Siu-Sing Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of lateral silicide growth in integrated circuit technology
- Patent number 7,064,067
- Issue date Jun 20, 2006
- Advanced Micro Devices, Inc.
- Paul L. King
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trenches to reduce lateral silicide growth in integrated circuit te...
- Patent number 7,023,059
- Issue date Apr 4, 2006
- Advanced Micro Devices, Inc.
- Darin A. Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selectable open circuit and anti-fuse element, and fabrication meth...
- Patent number 7,015,076
- Issue date Mar 21, 2006
- Advanced Micro Devices, Inc.
- Darin A. Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low stress sidewall spacer in integrated circuit technology
- Patent number 7,005,357
- Issue date Feb 28, 2006
- Advanced Micro Devices, Inc.
- Minh Van Ngo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-silicide in integrated circuit technology
- Patent number 6,969,678
- Issue date Nov 29, 2005
- Advanced Micro Devices, Inc.
- Robert J. Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array of gate dielectric structures to measure gate dielectric thic...
- Patent number 6,964,875
- Issue date Nov 15, 2005
- Advanced Micro Devices, Inc.
- William G. En
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array of gate dielectric structures to measure gate dielectric thic...
- Patent number 6,841,832
- Issue date Jan 11, 2005
- Advanced Micro Devices, Inc.
- William G. En
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090032888
- Publication date Feb 5, 2009
- Advanced Micro Devices, Inc.
- William G. En
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT SYSTEM WITH MEMORY SYSTEM
- Publication number 20080150042
- Publication date Jun 26, 2008
- SPANSION LLC
- Simon Siu-Sing Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT SYSTEM WITH MEMORY SYSTEM
- Publication number 20080153224
- Publication date Jun 26, 2008
- SPANSION LLC
- Connie Pin Chin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY SYSTEM WITH POLY METAL GATE
- Publication number 20080149990
- Publication date Jun 26, 2008
- SPANSION LLC
- Connie Pin Chin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT SYSTEM WITH MEMORY SYSTEM
- Publication number 20080150011
- Publication date Jun 26, 2008
- SPANSION LLC
- Simon Siu-Sing Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT SYSTEM WITH IMPLANT OXIDE
- Publication number 20080142874
- Publication date Jun 19, 2008
- SPANSION LLC
- Shenqing Fang
- H01 - BASIC ELECTRIC ELEMENTS

Simon Siu-Sing Chan

Person

Patents Grantslast 30 patents

Integrated circuit system with memory system

Integrated circuit eliminating source/drain junction spiking

Multi-silicide system in integrated circuit technology

Contact liner in integrated circuit technology

Method of forming a semiconductor device

Selectable open circuit and anti-fuse element

Method of eliminating source/drain junction spiking, and device pro...

Reduction of lateral silicide growth in integrated circuit technology

Trenches to reduce lateral silicide growth in integrated circuit te...

Selectable open circuit and anti-fuse element, and fabrication meth...

Low stress sidewall spacer in integrated circuit technology

Multi-silicide in integrated circuit technology

Array of gate dielectric structures to measure gate dielectric thic...

Array of gate dielectric structures to measure gate dielectric thic...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

INTEGRATED CIRCUIT SYSTEM WITH MEMORY SYSTEM

INTEGRATED CIRCUIT SYSTEM WITH MEMORY SYSTEM

MEMORY SYSTEM WITH POLY METAL GATE

INTEGRATED CIRCUIT SYSTEM WITH MEMORY SYSTEM

INTEGRATED CIRCUIT SYSTEM WITH IMPLANT OXIDE