Simon Voong

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San Francisco, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Enhanced scanning control of charged particle beam systems
- Patent number 7,230,240
- Issue date Jun 12, 2007
- Credence Systems Corporation
- James Siebert
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Enhanced scanning control of charged particle beam systems
- Publication number 20060043312
- Publication date Mar 2, 2006
- James Siebert
- H01 - BASIC ELECTRIC ELEMENTS