Simon WHITE

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Suffolk, GB

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Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20170025317
- Publication date Jan 26, 2017
- Nordson Corporation
- John TINGAY
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20170018467
- Publication date Jan 19, 2017
- Nordson Corporation
- William T. WALKER
- G01 - MEASURING TESTING