Simranjit S. Khalsa

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Chandler, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated cable probe design for high bandwidth RF testing
- Patent number 11,226,353
- Issue date Jan 18, 2022
- Intel Corporation
- Chengqing Hu
- G01 - MEASURING TESTING
Information Patent Grant
High power terahertz impulse for fault isolation
- Patent number 10,746,780
- Issue date Aug 18, 2020
- Intel Corporation
- Mayue Xie
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CABLE PROBE DESIGN FOR HIGH BANDWIDTH RF TESTING
- Publication number 20210132113
- Publication date May 6, 2021
- Intel Corporation
- Chengqing Hu
- G01 - MEASURING TESTING
Information Patent Application
HIGH POWER TERAHERTZ IMPULSE FOR FAULT ISOLATION
- Publication number 20180335465
- Publication date Nov 22, 2018
- Intel Corporation
- Mayue Xie
- G01 - MEASURING TESTING