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Sinha Harsh
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for edge-of-wafer inspection and review
Patent number
10,770,258
Issue date
Sep 8, 2020
KLA-Tencor Corporation
Xinrong Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for defect classification
Patent number
10,482,590
Issue date
Nov 19, 2019
KLA-Tencor Corporation
Li He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for edge-of-wafer inspection and review
Patent number
10,056,224
Issue date
Aug 21, 2018
KLA-Tencor Corporation
Xinrong Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for iterative defect classification
Patent number
9,922,269
Issue date
Mar 20, 2018
KLA-Tencor Corporation
Sankar Venkataraman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for defect classification
Patent number
9,898,811
Issue date
Feb 20, 2018
KLA-Tencor Corporation
Li He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated decision-based energy-dispersive x-ray methodology and ap...
Patent number
9,696,268
Issue date
Jul 4, 2017
KLA-Tencor Corporation
Harsh Sinha
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for preparation of samples for sub-surface defe...
Patent number
9,318,395
Issue date
Apr 19, 2016
KLA-Tencor Corporation
Cecelia Campochiaro
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Method and System for Edge-of-Wafer Inspection and Review
Publication number
20190006143
Publication date
Jan 3, 2019
KLA-Tencor Corporation
Xinrong Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and System for Defect Classification
Publication number
20180114310
Publication date
Apr 26, 2018
KLA-Tencor Corporation
Li He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and System for Edge-of-Wafer Inspection and Review
Publication number
20170047193
Publication date
Feb 16, 2017
KLA-Tencor Corporation
Xinrong Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and System for Iterative Defect Classification
Publication number
20160358041
Publication date
Dec 8, 2016
KLA-Tencor Corporation
Sankar Venkataraman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and System for Defect Classification
Publication number
20160328837
Publication date
Nov 10, 2016
KLA-Tencor Corporation
Li He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATED DECISION-BASED ENERGY-DISPERSIVE X-RAY METHODOLOGY AND AP...
Publication number
20160116425
Publication date
Apr 28, 2016
KLA-Tencor Corporation
Harsh SINHA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR PREPARATION OF SAMPLES FOR SUB-SURFACE DEFE...
Publication number
20130137193
Publication date
May 30, 2013
KLA-Tencor Corporation
Cecelia CAMPOCHIARO
H01 - BASIC ELECTRIC ELEMENTS