Siu May Ho

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for storing and retrieving semiconductor tester i...
- Patent number 8,725,748
- Issue date May 13, 2014
- Advanced Micro Devices, Inc.
- Srikanth Sundararajan
- G01 - MEASURING TESTING
Information Patent Grant
Efficient storage of fail data to aid in fault isolation
- Patent number 7,634,127
- Issue date Dec 15, 2009
- Advanced Micro Devices, Inc.
- Srikanth Sundararajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer level global bitmap characterization in integrated circuit te...
- Patent number 7,137,085
- Issue date Nov 14, 2006
- Advanced Micro Devices, Inc.
- John J. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for characterizing floating body effects in S...
- Patent number 6,774,395
- Issue date Aug 10, 2004
- Advanced Micro Devices, Inc.
- Hung-Jen Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for predicting performance of microelectronic device based o...
- Patent number 6,028,994
- Issue date Feb 22, 2000
- Advanced Micro Devices
- Yeng-Kaung Peng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for pattern recognition of wafer test bins
- Patent number 5,787,190
- Issue date Jul 28, 1998
- Advanced Micro Devices, Inc.
- Yeng-Kaung Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time in-line defect disposition and yield forecasting system
- Patent number 5,598,341
- Issue date Jan 28, 1997
- Advanced Micro Devices, Inc.
- Zhi-Min Ling
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

Method and system for storing and retrieving semiconductor tester i...

Efficient storage of fail data to aid in fault isolation

Wafer level global bitmap characterization in integrated circuit te...

Apparatus and methods for characterizing floating body effects in S...

Method for predicting performance of microelectronic device based o...

Method and apparatus for pattern recognition of wafer test bins

Real-time in-line defect disposition and yield forecasting system