Siva Kumar

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection system that integrates manifest data with imaging/...
- Patent number 9,632,206
- Issue date Apr 25, 2017
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection system that integrates manifest data with imaging/...
- Patent number 9,111,331
- Issue date Aug 18, 2015
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated, portable checkpoint system
- Patent number 9,069,101
- Issue date Jun 30, 2015
- Rapiscan Systems, Inc.
- Luis E Arroyo
- G01 - MEASURING TESTING
Information Patent Grant
Integrated portable checkpoint system
- Patent number 8,731,137
- Issue date May 20, 2014
- Rapiscan Systems, Inc.
- Luis E. Arroyo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-Ray Inspection System That Integrates Manifest Data With Imaging/...
- Publication number 20170299765
- Publication date Oct 19, 2017
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Inspection System That Integrates Manifest Data With Imaging/...
- Publication number 20160097877
- Publication date Apr 7, 2016
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G01 - MEASURING TESTING
Information Patent Application
Integrated, Portable Checkpoint System
- Publication number 20140341344
- Publication date Nov 20, 2014
- Rapiscan Systems, Inc.
- Luis E Arroyo
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION SYSTEM THAT INTEGRATES MANIFEST DATA WITH IMAGING/...
- Publication number 20130101172
- Publication date Apr 25, 2013
- Shehul Sailesh Parikh
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED PORTABLE CHECKPOINT SYSTEM
- Publication number 20120148020
- Publication date Jun 14, 2012
- Luis E. Arroyo, JR.
- G01 - MEASURING TESTING