Siyuan Frank Yang

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method and computer code for statistical process control for censor...
- Patent number 8,024,139
- Issue date Sep 20, 2011
- Semiconductor Manufacturing International (Shanghai) Corporation
- Siyuan Frank Yang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Knowledge-based statistical method and system to determine reliabil...
- Patent number 7,660,699
- Issue date Feb 9, 2010
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Kary Chien
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Using reverse arrangement for trend test in statistical process con...
- Patent number 7,595,205
- Issue date Sep 29, 2009
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Kary Chien
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Method and Computer Code for Statistical Process Control for Censor...
- Publication number 20090216470
- Publication date Aug 27, 2009
- Semiconductor Manufacturing International (Shanghai) Corporation
- Siyuan Frank Yang
- G05 - CONTROLLING REGULATING
Information Patent Application
Using reverse arrangement for trend test in statistical process con...
- Publication number 20070231933
- Publication date Oct 4, 2007
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Kary Chien
- G05 - CONTROLLING REGULATING
Information Patent Application
Knowledge-based statistical method and system to determine reliabil...
- Publication number 20070032973
- Publication date Feb 8, 2007
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Kary Chien
- G05 - CONTROLLING REGULATING