SMADAR FERBER

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REHOVOT, IL

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Patents Grantslast 30 patents

Information Patent Grant
Time-domain optical metrology and inspection of semiconductor devices
- Patent number 11,366,398
- Issue date Jun 21, 2022
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES
- Publication number 20240271926
- Publication date Aug 15, 2024
- NOVA LTD
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20220390858
- Publication date Dec 8, 2022
- NOVA LTD
- GILAD BARAK
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20210247699
- Publication date Aug 12, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- G01 - MEASURING TESTING