Snezana Bogdanovich

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Newark, DE, US

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Patents Grantslast 30 patents

Information Patent Grant
Amorphous selenium flat panel x-ray imager for tomosynthesis and st...
- Patent number 7,304,308
- Issue date Dec 4, 2007
- Hologic, Inc.
- Lawrence Cheung
- G01 - MEASURING TESTING
Information Patent Grant
Diode design to reduce the effects of radiation damage
- Patent number 7,259,377
- Issue date Aug 21, 2007
- General Electric Company
- Scott Stephen Zelakiewicz
- G01 - MEASURING TESTING
Information Patent Grant
Amorphous selenium flat panel x-ray imager for tomosynthesis and st...
- Patent number 7,233,005
- Issue date Jun 19, 2007
- Hologic, Inc.
- Snezana Bogdanovich
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DIODE DESIGN TO REDUCE THE EFFECTS OF RADIATION DAMAGE
- Publication number 20070138397
- Publication date Jun 21, 2007
- Scott Stephen Zelakiewicz
- G01 - MEASURING TESTING
Information Patent Application
Amorphous selenium flat panel x-ray imager for tomosynthesis and st...
- Publication number 20060192131
- Publication date Aug 31, 2006
- Lawrence Cheung
- G01 - MEASURING TESTING
Information Patent Application
Amorphous selenium flat panel x-ray imager for tomosynthesis and st...
- Publication number 20060180768
- Publication date Aug 17, 2006
- Snezana Bogdanovich
- H01 - BASIC ELECTRIC ELEMENTS