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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and object-distance measuring appa...
- Patent number 9,109,887
- Issue date Aug 18, 2015
- Renesas Electronics Corporation
- So Otsuka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND OBJECT-DISTANCE MEASURING APPA...
- Publication number 20140036067
- Publication date Feb 6, 2014
- FUTURE UNIVERSITY HAKODATE
- So Otsuka
- G01 - MEASURING TESTING