Sofiane Ellouz

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Paris, FR

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Patents Grantslast 30 patents

Information Patent Grant
RF circuit analysis
- Patent number 8,207,727
- Issue date Jun 26, 2012
- NXP B.V.
- Christophe Kelma
- G01 - MEASURING TESTING
Information Patent Grant
Wafer with scribe lanes comprising external pads and/or active circ...
- Patent number 8,173,448
- Issue date May 8, 2012
- NXP B.V.
- Herve Marie
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RF CIRCUIT ANALYSIS
- Publication number 20100013455
- Publication date Jan 21, 2010
- NXP, B.V.
- Christophe Kelma
- G01 - MEASURING TESTING
Information Patent Application
WAFER WITH SCRIBE LANES COMPRISING ACTIVE CIRCUITS FOR DIE TESTING...
- Publication number 20090152546
- Publication date Jun 18, 2009
- NXP B.V.
- Herve Marie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER WITH SCRIBE LANES COMPRISING EXTERNAL PADS AND/OR ACTIVE CIRC...
- Publication number 20090127553
- Publication date May 21, 2009
- NXP B.V.
- Herve Marie
- H01 - BASIC ELECTRIC ELEMENTS