Soichiro Matsunaga

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron source and charged particle beam device
- Patent number 11,929,230
- Issue date Mar 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for controlling electron beam ap...
- Patent number 11,894,211
- Issue date Feb 6, 2024
- HITACHI HIGH-TECH CORPORATION
- Erina Kawamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermoelectric field emission electron source and electron beam app...
- Patent number 11,508,544
- Issue date Nov 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Soichiro Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source, method for manufacturing the same, and electron be...
- Patent number 11,322,329
- Issue date May 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron beam application device
- Patent number 11,227,740
- Issue date Jan 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Soichiro Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,903,037
- Issue date Jan 26, 2021
- HITACHI HIGH-TECH CORPORATION
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,006,654
- Issue date Apr 14, 2015
- Hitachi High-Technologies Corporation
- Soichiro Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON SOURCE, ELECTRON GUN, AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20230352262
- Publication date Nov 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy Filter, and Energy Analyzer and Charged Particle Beam Device...
- Publication number 20230298845
- Publication date Sep 21, 2023
- Hitachi High-Tech Corporation
- Kazuhiro HONDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS AND METHOD FOR CONTROLLING ELECTRON BEAM AP...
- Publication number 20220351934
- Publication date Nov 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Erina KAWAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20220199349
- Publication date Jun 23, 2022
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMOELECTRIC FIELD EMISSION ELECTRON SOURCE AND ELECTRON BEAM APP...
- Publication number 20220037107
- Publication date Feb 3, 2022
- Hitachi High-Tech Corporation
- Soichiro Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRON BE...
- Publication number 20210327674
- Publication date Oct 21, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE
- Publication number 20200266020
- Publication date Aug 20, 2020
- Hitachi High-Technologies Corporation
- Soichiro MATSUNAGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20200090897
- Publication date Mar 19, 2020
- Hitachi High-Technologies Corporation
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE AND ELECTRON BEAM IRRADIATION DEVICE
- Publication number 20190198284
- Publication date Jun 27, 2019
- Hitachi High-Technologies Corporation
- Soichiro MATSUNAGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150034835
- Publication date Feb 5, 2015
- Hitachi High-Technologies Corporation
- Soichiro Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS

Soichiro Matsunaga

Person

Patents Grantslast 30 patents

Electron source and charged particle beam device

Electron beam apparatus and method for controlling electron beam ap...

Thermoelectric field emission electron source and electron beam app...

Electron source, method for manufacturing the same, and electron be...

Electron gun and electron beam application device

Charged particle beam device

Charged particle beam apparatus

Patents Applicationslast 30 patents

ELECTRON SOURCE, ELECTRON GUN, AND CHARGED PARTICLE BEAM DEVICE

Energy Filter, and Energy Analyzer and Charged Particle Beam Device...

ELECTRON BEAM APPARATUS AND METHOD FOR CONTROLLING ELECTRON BEAM AP...

ELECTRON SOURCE AND CHARGED PARTICLE BEAM DEVICE

THERMOELECTRIC FIELD EMISSION ELECTRON SOURCE AND ELECTRON BEAM APP...

ELECTRON SOURCE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRON BE...

ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE

CHARGED PARTICLE BEAM DEVICE

ELECTRON SOURCE AND ELECTRON BEAM IRRADIATION DEVICE

CHARGED PARTICLE BEAM APPARATUS