Membership
Tour
Register
Log in
Sojuro Kato
Follow
Person
Nasushiobara-shi, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
MRI RF coil control signals modulated onto the RF coil clock signal
Patent number
9,052,367
Issue date
Jun 9, 2015
Kabushiki Kaisha Toshiba
Koji Akita
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging apparatus and method with wireless trans...
Patent number
8,947,091
Issue date
Feb 3, 2015
Kabushiki Kaisha Toshiba
Toshiyuki Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging apparatus including elements for phase c...
Patent number
8,704,522
Issue date
Apr 22, 2014
Kabushiki Kaisha Toshiba
Koji Akita
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging apparatus having controller that sets ca...
Patent number
8,643,362
Issue date
Feb 4, 2014
Kabushiki Kaisha Toshiba
Takahiro Sekiguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MAGNETIC RESONANCE IMAGING APPARATUS AND MAGNETIC RESONANCE IMAGING...
Publication number
20150276910
Publication date
Oct 1, 2015
Kabushiki Kaisha Toshiba
Kazuyuki SOEJIMA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE IMAGING APPARATUS
Publication number
20110227574
Publication date
Sep 22, 2011
Koji Akita
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE IMAGING APPARATUS
Publication number
20110227571
Publication date
Sep 22, 2011
Kabushiki Kaisha Toshiba
Takahiro Sekiguchi
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE IMAGING APPARATUS, PHASE COMPARATOR, CONTROL UNI...
Publication number
20110109316
Publication date
May 12, 2011
Kabushiki Kaisha Toshiba
Koji AKITA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE IMAGING APPARATUS AND MAGNETIC RESONANCE IMAGING...
Publication number
20110101977
Publication date
May 5, 2011
Kabushiki Kaisha Toshiba
Toshiyuki NAKANISHI
G01 - MEASURING TESTING