Sol-Lee Hwang

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Overlay measurement device and method, and system and program therefor
- Patent number 12,341,047
- Issue date Jun 24, 2025
- AUROS TECHNOLOGY, INC.
- Sol-Lee Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlay measurement device and method, and system and program therefor
- Patent number 12,334,382
- Issue date Jun 17, 2025
- AUROS TECHNOLOGY, INC.
- Sol-Lee Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computer-readable storage medium recording data structure for stori...
- Patent number 12,235,590
- Issue date Feb 25, 2025
- AUROS TECHNOLOGY, INC.
- Sol-Lee Hwang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computer-readable storage medium recording data structure for stori...
- Patent number 12,169,365
- Issue date Dec 17, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee Hwang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computer-readable storage medium recording data structure for stori...
- Patent number 12,169,364
- Issue date Dec 17, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee Hwang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Overlay measurement device and method, and system and program therefor
- Patent number 12,009,243
- Issue date Jun 11, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computer-readable storage medium recording data structure for stori...
- Patent number 11,960,214
- Issue date Apr 16, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee Hwang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
FOCUS OPTIMIZATION FOR WAFER WHICH HAS MULTI-PEAK FOCUS
- Publication number 20240377190
- Publication date Nov 14, 2024
- Samsung Electronics Co., Ltd.
- Jun Yeob KIM
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT DEVICE AND METHOD
- Publication number 20240249436
- Publication date Jul 25, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee HWANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OVERLAY MEASUREMENT DEVICE AND METHOD, AND SYSTEM AND PROGRAM THEREFOR
- Publication number 20240186169
- Publication date Jun 6, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee HWANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAY MEASUREMENT DEVICE AND METHOD, AND SYSTEM AND PROGRAM THEREFOR
- Publication number 20240178037
- Publication date May 30, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee HWANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTER-READABLE STORAGE MEDIUM RECORDING DATA STRUCTURE FOR STORI...
- Publication number 20240176251
- Publication date May 30, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee HWANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPUTER-READABLE STORAGE MEDIUM RECORDING DATA STRUCTURE FOR STORI...
- Publication number 20240176253
- Publication date May 30, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee HWANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPUTER-READABLE STORAGE MEDIUM RECORDING DATA STRUCTURE FOR STORI...
- Publication number 20240176252
- Publication date May 30, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee HWANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OVERLAY MEASUREMENT DEVICE AND METHOD, AND SYSTEM AND PROGRAM THEREFOR
- Publication number 20240178038
- Publication date May 30, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee HWANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAY MEASUREMENT DEVICE AND METHOD, AND SYSTEM AND PROGRAM THEREFOR
- Publication number 20240128112
- Publication date Apr 18, 2024
- AUROS TECHNOLOGY, INC.
- Sol-Lee HWANG
- H01 - BASIC ELECTRIC ELEMENTS

Sol-Lee Hwang

Person

Patents Grantslast 30 patents

Overlay measurement device and method, and system and program therefor

Overlay measurement device and method, and system and program therefor

Computer-readable storage medium recording data structure for stori...

Computer-readable storage medium recording data structure for stori...

Computer-readable storage medium recording data structure for stori...

Overlay measurement device and method, and system and program therefor

Computer-readable storage medium recording data structure for stori...

Patents Applicationslast 30 patents

FOCUS OPTIMIZATION FOR WAFER WHICH HAS MULTI-PEAK FOCUS

ARRANGEMENT DEVICE AND METHOD

OVERLAY MEASUREMENT DEVICE AND METHOD, AND SYSTEM AND PROGRAM THEREFOR

OVERLAY MEASUREMENT DEVICE AND METHOD, AND SYSTEM AND PROGRAM THEREFOR

COMPUTER-READABLE STORAGE MEDIUM RECORDING DATA STRUCTURE FOR STORI...

COMPUTER-READABLE STORAGE MEDIUM RECORDING DATA STRUCTURE FOR STORI...

COMPUTER-READABLE STORAGE MEDIUM RECORDING DATA STRUCTURE FOR STORI...

OVERLAY MEASUREMENT DEVICE AND METHOD, AND SYSTEM AND PROGRAM THEREFOR

OVERLAY MEASUREMENT DEVICE AND METHOD, AND SYSTEM AND PROGRAM THEREFOR