Sol Lee

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Chungcheongnam-do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing a semiconductor package
- Patent number 12,169,219
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,994,554
- Issue date May 28, 2024
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,940,484
- Issue date Mar 26, 2024
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS FOR IMAGE SENSOR PACKAGE
- Publication number 20240151769
- Publication date May 9, 2024
- TSE CO., LTD
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR A SEMICONDUCTOR PACKAGE
- Publication number 20230384368
- Publication date Nov 30, 2023
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE
- Publication number 20230384364
- Publication date Nov 30, 2023
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR TESTING A MOBILE AP
- Publication number 20230236941
- Publication date Jul 27, 2023
- TSE CO., LTD.
- Min Cheol KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20230069125
- Publication date Mar 2, 2023
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20230065997
- Publication date Mar 2, 2023
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING