Somit Joshi

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect sampling for electron beam review based on defect attributes...
- Patent number 9,535,010
- Issue date Jan 3, 2017
- KLA-Tencor Corp.
- Rohan Gosain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single mask MIM capacitor and resistor with in trench copper drift...
- Patent number 7,189,615
- Issue date Mar 13, 2007
- Texas Instruments Incorporated
- Satyavolu Srinivas Papa Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shallow trench isolation planarization using self aligned isotropic...
- Patent number 6,686,283
- Issue date Feb 3, 2004
- Texas Instruments Incorporated
- Shawn T. Walsh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Defect Sampling for Electron Beam Review Based on Defect Attributes...
- Publication number 20150330912
- Publication date Nov 19, 2015
- KLA-Tencor Corporation
- Rohan Gosain
- G01 - MEASURING TESTING
Information Patent Application
Single mask MIM capacitor and resistor with in trench copper drift...
- Publication number 20060160299
- Publication date Jul 20, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Satyavolu Srinivas Papa Rao
- H01 - BASIC ELECTRIC ELEMENTS