Son Le

Person

Gilroy, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring saturation magnetization of magnetic films and...
- Patent number 11,609,296
- Issue date Mar 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Santiago Serrano Guisan
- G01 - MEASURING TESTING
Information Patent Grant
Ferromagnetic resonance (FMR) electrical testing apparatus for spin...
- Patent number 11,397,226
- Issue date Jul 26, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Guenole Jan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level...
- Patent number 11,237,240
- Issue date Feb 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Santiago Serrano Guisan
- G01 - MEASURING TESTING
Information Patent Grant
Scanning ferromagnetic resonance (FMR) for wafer-level characteriza...
- Patent number 11,092,661
- Issue date Aug 17, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Santiago Serrano Guisan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring saturation magnetization of magnetic films and...
- Patent number 10,788,561
- Issue date Sep 29, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Santiago Serrano Guisan
- G01 - MEASURING TESTING
Information Patent Grant
Ferromagnetic resonance (FMR) electrical testing apparatus for spin...
- Patent number 10,761,154
- Issue date Sep 1, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Guenole Jan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level...
- Patent number 10,754,000
- Issue date Aug 25, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Santiago Serrano Guisan
- G01 - MEASURING TESTING
Information Patent Grant
Scanning ferromagnetic resonance (FMR) for wafer-level characteriza...
- Patent number 10,401,464
- Issue date Sep 3, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Santiago Serrano Guisan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for performing more consistent switching of magne...
- Patent number 7,123,506
- Issue date Oct 17, 2006
- Applied Spintronics Technology, Inc.
- Xizeng Shi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method for Measuring Saturation Magnetization of Magnetic Films and...
- Publication number 20210025958
- Publication date Jan 28, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Santiago Serrano Guisan
- G01 - MEASURING TESTING
Information Patent Application
Ferromagnetic Resonance (FMR) Electrical Testing Apparatus for Spin...
- Publication number 20200393525
- Publication date Dec 17, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Guenole Jan
- G01 - MEASURING TESTING
Information Patent Application
Multi-Probe Ferromagnetic Resonance (FMR) Apparatus for Wafer Level...
- Publication number 20200386840
- Publication date Dec 10, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Santiago Serrano Guisan
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring Saturation magnetization of Magnetic Films and...
- Publication number 20200116811
- Publication date Apr 16, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Santiago Serrano Guisan
- G01 - MEASURING TESTING
Information Patent Application
Multi-Probe Ferromagnetic Resonance (FMR) Apparatus for Wafer Level...
- Publication number 20200049787
- Publication date Feb 13, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Santiago Serrano Guisan
- G01 - MEASURING TESTING
Information Patent Application
Scanning Ferromagnetic Resonance (FMR) for Wafer-Level Characteriza...
- Publication number 20190331752
- Publication date Oct 31, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Santiago Serrano Guisan
- G01 - MEASURING TESTING
Information Patent Application
Ferromagnetic Resonance (FMR) Electrical Testing Apparatus for Spin...
- Publication number 20190227132
- Publication date Jul 25, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Guenole Jan
- G01 - MEASURING TESTING
Information Patent Application
Scanning Ferromagnetic Resonance (FMR) for Wafer-Level Characteriza...
- Publication number 20180267128
- Publication date Sep 20, 2018
- HEADWAY TECHNOLOGIES, INC.
- Santiago Serrano Guisan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for performing more consistent switching of magne...
- Publication number 20050180201
- Publication date Aug 18, 2005
- Xizeng Shi
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

Method for measuring saturation magnetization of magnetic films and...

Ferromagnetic resonance (FMR) electrical testing apparatus for spin...

Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level...

Scanning ferromagnetic resonance (FMR) for wafer-level characteriza...

Method for measuring saturation magnetization of magnetic films and...

Ferromagnetic resonance (FMR) electrical testing apparatus for spin...

Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level...

Scanning ferromagnetic resonance (FMR) for wafer-level characteriza...

Method and system for performing more consistent switching of magne...

Patents Applicationslast 30 patents

Method for Measuring Saturation Magnetization of Magnetic Films and...

Ferromagnetic Resonance (FMR) Electrical Testing Apparatus for Spin...

Multi-Probe Ferromagnetic Resonance (FMR) Apparatus for Wafer Level...

Method for Measuring Saturation magnetization of Magnetic Films and...

Multi-Probe Ferromagnetic Resonance (FMR) Apparatus for Wafer Level...

Scanning Ferromagnetic Resonance (FMR) for Wafer-Level Characteriza...

Ferromagnetic Resonance (FMR) Electrical Testing Apparatus for Spin...

Scanning Ferromagnetic Resonance (FMR) for Wafer-Level Characteriza...

Method and system for performing more consistent switching of magne...