Son N. Dang

Person

Tempe, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for processing one or more integrated circuit p...
- Patent number 12,076,833
- Issue date Sep 3, 2024
- Nidec SV Probe Pte. Ltd.
- Son N. Dang
- B24 - GRINDING POLISHING
Information Patent Grant
Modular space transformer for fine pitch vertical probing applications
- Patent number 8,430,676
- Issue date Apr 30, 2013
- SV Probe Pte. Ltd.
- Son Dang
- G01 - MEASURING TESTING
Information Patent Grant
Probe head structure for probe test cards
- Patent number 8,222,912
- Issue date Jul 17, 2012
- SV Probe Pte. Ltd.
- Son N. Dang
- G01 - MEASURING TESTING
Information Patent Grant
Dual tip test probe assembly
- Patent number 8,026,734
- Issue date Sep 27, 2011
- SV Probe Pte. Ltd.
- Son Ngoc Dang
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card
- Patent number 7,679,383
- Issue date Mar 16, 2010
- SV Probe Pte. Ltd.
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Grant
Method of probe tip shaping and cleaning
- Patent number 7,182,672
- Issue date Feb 27, 2007
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for probe tip cleaning and shaping pad
- Patent number 6,908,364
- Issue date Jun 21, 2005
- Kulicke and Soffa Industries, Inc.
- Gerald W. Back
- B24 - GRINDING POLISHING
Information Patent Grant
Alignment guide and signal transmission apparatus and method for sp...
- Patent number 6,426,637
- Issue date Jul 30, 2002
- Cerprobe Corporation
- Son N. Dang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR PROCESSING ONE OR MORE INTEGRATED CIRCUIT P...
- Publication number 20210078133
- Publication date Mar 18, 2021
- Nidec Motor Corporation
- Son N. Dang
- G01 - MEASURING TESTING
Information Patent Application
Modular Space Transformer For Fine Pitch Vertical Probing Applications
- Publication number 20110032063
- Publication date Feb 10, 2011
- Son Dang
- G01 - MEASURING TESTING
Information Patent Application
Dual Tip Test Probe Assembly
- Publication number 20100327894
- Publication date Dec 30, 2010
- Son Ngoc Dang
- G01 - MEASURING TESTING
Information Patent Application
Probe Head Structure For Probe Test Cards
- Publication number 20100231249
- Publication date Sep 16, 2010
- Son N. Dang
- G01 - MEASURING TESTING
Information Patent Application
Bond Reinforcement Layer for Probe Test Cards
- Publication number 20090174423
- Publication date Jul 9, 2009
- Peter J. Klaerner
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probe card
- Publication number 20080204062
- Publication date Aug 28, 2008
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Application
Method of probe tip shaping and cleaning
- Publication number 20050260937
- Publication date Nov 24, 2005
- K&S Interconnect, Inc.
- Bahadir Tunaboylu
- B24 - GRINDING POLISHING
Information Patent Application
Method and apparatus for probe tip cleaning and shaping pad
- Publication number 20030027496
- Publication date Feb 6, 2003
- Gerald W. Back
- B24 - GRINDING POLISHING

Son N. Dang

Person

Patents Grantslast 30 patents

Methods and systems for processing one or more integrated circuit p...

Modular space transformer for fine pitch vertical probing applications

Probe head structure for probe test cards

Dual tip test probe assembly

Cantilever probe card

Method of probe tip shaping and cleaning

Method and apparatus for probe tip cleaning and shaping pad

Alignment guide and signal transmission apparatus and method for sp...

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR PROCESSING ONE OR MORE INTEGRATED CIRCUIT P...

Modular Space Transformer For Fine Pitch Vertical Probing Applications

Dual Tip Test Probe Assembly

Probe Head Structure For Probe Test Cards

Bond Reinforcement Layer for Probe Test Cards

Cantilever probe card

Method of probe tip shaping and cleaning

Method and apparatus for probe tip cleaning and shaping pad