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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting overlay precision and method for compensating...
- Patent number 11,988,968
- Issue date May 21, 2024
- Semiconductor Manufacturing International (Shanghai) Corporation
- Song Bai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing a semiconductor structure by forming a mask...
- Patent number 11,587,836
- Issue date Feb 21, 2023
- Semiconductor Manufacturing International (Shanghai) Corporation
- Song Bai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING OVERLAY PRECISION AND METHOD FOR COMPENSATING...
- Publication number 20210208514
- Publication date Jul 8, 2021
- Semiconductor Manufacturing International (Shanghai) Corporation
- Song BAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF
- Publication number 20210090960
- Publication date Mar 25, 2021
- Semiconductor Manufacturing International (Shanghai) Corporation
- Song BAI
- H01 - BASIC ELECTRIC ELEMENTS