Songnian Rong

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for mixed mode wafer inspection
- Patent number 10,192,303
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image based specimen process control
- Patent number 10,181,185
- Issue date Jan 15, 2019
- KLA-Tencor Corp.
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for universal target based inspection and metrology
- Patent number 9,576,861
- Issue date Feb 21, 2017
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data perturbation for wafer inspection or metrology setup using a m...
- Patent number 9,360,863
- Issue date Jun 7, 2016
- KLA-Tencor Corp.
- Govind Thattaisundaram
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automated inspection scenario generation
- Patent number 9,053,390
- Issue date Jun 9, 2015
- KLA-Tencor Corporation
- Mohan Mahadevan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Region based virtual fourier filter
- Patent number 8,989,479
- Issue date Mar 24, 2015
- KLA-Tencor Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Mixed Mode Wafer Inspection
- Publication number 20190108630
- Publication date Apr 11, 2019
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE BASED SPECIMEN PROCESS CONTROL
- Publication number 20170200264
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Universal Target Based Inspection and Metrology
- Publication number 20140199791
- Publication date Jul 17, 2014
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Mixed Mode Wafer Inspection
- Publication number 20140153814
- Publication date Jun 5, 2014
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated Inspection Scenario Generation
- Publication number 20140050389
- Publication date Feb 20, 2014
- KLA-Tencor Corporation
- Mohan Mahadevan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REGION BASED VIRTUAL FOURIER FILTER
- Publication number 20120141013
- Publication date Jun 7, 2012
- KLA-Tencor Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data Perturbation for Wafer Inspection or Metrology Setup
- Publication number 20120116733
- Publication date May 10, 2012
- KLA-Tencor Corporation
- Govind Thattaisundaram
- G05 - CONTROLLING REGULATING

Songnian Rong

Person

Patents Grantslast 30 patents

Method and system for mixed mode wafer inspection

Image based specimen process control

Method and system for universal target based inspection and metrology

Data perturbation for wafer inspection or metrology setup using a m...

Automated inspection scenario generation

Region based virtual fourier filter

Patents Applicationslast 30 patents

Method and System for Mixed Mode Wafer Inspection

IMAGE BASED SPECIMEN PROCESS CONTROL

Method and System for Universal Target Based Inspection and Metrology

Method and System for Mixed Mode Wafer Inspection

Automated Inspection Scenario Generation

REGION BASED VIRTUAL FOURIER FILTER

Data Perturbation for Wafer Inspection or Metrology Setup