Membership
Tour
Register
Log in
Soo-Bok CHIN
Follow
Person
Seoul, KR
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Methods for monitoring semiconductor fabrication processes using po...
Patent number
9,551,653
Issue date
Jan 24, 2017
Samsung Electronics Co., Ltd.
Woong-Kyu Son
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus and method for monitoring semiconductor fabrication proce...
Patent number
9,322,771
Issue date
Apr 26, 2016
Samsung Electronics Co., Ltd.
Woong-Kyu Son
G01 - MEASURING TESTING
Information
Patent Grant
Method of analyzing photolithography processes
Patent number
9,165,354
Issue date
Oct 20, 2015
Samsung Electronics Co., Ltd.
Woong-Kyu Son
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for detecting defect of substrate
Patent number
8,890,069
Issue date
Nov 18, 2014
Samsung Electronics Co., Ltd.
Jong-Cheon Sun
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Methods for Monitoring Semiconductor Fabrication Processes Using Po...
Publication number
20160204043
Publication date
Jul 14, 2016
Woong-Kyu Son
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUSES FOR MEASURING VALUES OF PARAMETERS OF INTEG...
Publication number
20150219446
Publication date
Aug 6, 2015
Samsung Electronics Co., Ltd.
Choon-Shik LEEM
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MONITORING SEMICONDUCTOR FABRICATION PROCESS USING XPS
Publication number
20140342477
Publication date
Nov 20, 2014
Samsung Electronics Co., Ltd.
Choon-Shik LEEM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR DETECTING DEFECT OF SUBSTRATE
Publication number
20140306109
Publication date
Oct 16, 2014
Samsung Electronics Co., Ltd.
Jong-Cheon SUN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES AND METHODS FOR EXTRACTING DEFECT DEPTH INFORMATION AND...
Publication number
20140307052
Publication date
Oct 16, 2014
Samsung Electronics Co., Ltd.
Jeong-ho Ahn
G02 - OPTICS
Information
Patent Application
Apparatus and Method for Monitoring Semiconductor Fabrication Proce...
Publication number
20140264052
Publication date
Sep 18, 2014
Samsung Electronics Co., Ltd.
Woong-Kyu SON
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ANALYZING PHOTOLITHOGRAPHY PROCESSES
Publication number
20140037186
Publication date
Feb 6, 2014
Woong-Kyu Son
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF FORMING IMAGE OF SEMICONDUCTOR DEVICE, AND METHOD OF DETE...
Publication number
20120082367
Publication date
Apr 5, 2012
Samsung Electronics Co., Ltd.
Jung-hoon Byun
G06 - COMPUTING CALCULATING COUNTING