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Singapore, SG
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last 30 patents
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Patent Grant
Methods and apparatus for testing and burn-in of semiconductor devices
Patent number
6,856,155
Issue date
Feb 15, 2005
Micron Technology, Inc.
Wuu Yean Tay
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Methods and apparatus for testing and burn-in of semiconductor devices
Publication number
20040032273
Publication date
Feb 19, 2004
Wuu Yean Tay
G01 - MEASURING TESTING