Sooryong Lee

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Defect detection method of deep learning-based semiconductor device...
- Patent number 12,229,944
- Issue date Feb 18, 2025
- Samsung Electronics Co., Ltd.
- Kyenhee Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for correcting a mask layout and method of fabricating a sem...
- Patent number 10,620,547
- Issue date Apr 14, 2020
- Samsung Electronics Co., Ltd.
- Sung-Yong Moon
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for correcting assist-feature-printing errors...
- Patent number 7,979,812
- Issue date Jul 12, 2011
- Synopsys, Inc.
- Sunggon Jung
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
OPERATING METHOD OF ELECTRONIC DEVICE INCLUDING PROCESSOR EXECUTING...
- Publication number 20230281792
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Sooryong LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORNER ROUNDING METHOD OF OPC PATTERN BASED ON DEEP LEARNING, AND O...
- Publication number 20230280646
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Kyungsoo KIM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ELECTRONIC DEVICE INCLUDING PROCESSOR EXECUTING DEFECT DETECTION MO...
- Publication number 20230214990
- Publication date Jul 6, 2023
- Samsung Electronics Co., Ltd.
- Min-Cheol KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE-BASED SEMICONDUCTOR DEVICE PATTERNING METHOD USING DEEP NEURA...
- Publication number 20230197460
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Jaewon YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTING DEVICE FOR PREDICTING A PROFILE USING DEEP LEARNING AND O...
- Publication number 20230196545
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Hyeok Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TRAINING SEMICONDUCTOR PROCESS IMAGE GENERATOR
- Publication number 20230177815
- Publication date Jun 8, 2023
- Samsung Electronics Co., LTD
- Sangchul Yeo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION METHOD OF DEEP LEARNING-BASED SEMICONDUCTOR DEVICE...
- Publication number 20230169641
- Publication date Jun 1, 2023
- Samsung Electronics Co., Ltd.
- Kyenhee LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF FORMING OPTICAL PROXIMITY CORRECTION MODEL AND METHOD OF...
- Publication number 20230062677
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Sang Chul YEO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CORRECTING A MASK LAYOUT AND METHOD OF FABRICATING A SEM...
- Publication number 20190155169
- Publication date May 23, 2019
- Samsung Electronics Co., Ltd.
- Sung-Yong MOON
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR CORRECTING ASSIST-FEATURE-PRINTING ERRORS...
- Publication number 20100199255
- Publication date Aug 5, 2010
- Synopsys, Inc.
- Sunggon Jung
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Sooryong Lee

Person

Patents Grantslast 30 patents

Defect detection method of deep learning-based semiconductor device...

Method for correcting a mask layout and method of fabricating a sem...

Method and apparatus for correcting assist-feature-printing errors...

Patents Applicationslast 30 patents

OPERATING METHOD OF ELECTRONIC DEVICE INCLUDING PROCESSOR EXECUTING...

CORNER ROUNDING METHOD OF OPC PATTERN BASED ON DEEP LEARNING, AND O...

ELECTRONIC DEVICE INCLUDING PROCESSOR EXECUTING DEFECT DETECTION MO...

IMAGE-BASED SEMICONDUCTOR DEVICE PATTERNING METHOD USING DEEP NEURA...

COMPUTING DEVICE FOR PREDICTING A PROFILE USING DEEP LEARNING AND O...

METHOD OF TRAINING SEMICONDUCTOR PROCESS IMAGE GENERATOR

DEFECT DETECTION METHOD OF DEEP LEARNING-BASED SEMICONDUCTOR DEVICE...

METHOD OF FORMING OPTICAL PROXIMITY CORRECTION MODEL AND METHOD OF...

METHOD FOR CORRECTING A MASK LAYOUT AND METHOD OF FABRICATING A SEM...

METHOD AND APPARATUS FOR CORRECTING ASSIST-FEATURE-PRINTING ERRORS...