Sooyong PARK

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Asan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Test devices, test systems, and operating methods of test systems
- Patent number 12,111,351
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Impedance matching device for reducing reflection loss by splitting...
- Patent number 10,707,548
- Issue date Jul 7, 2020
- Samsung Electronics Co., Ltd.
- Jae Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test board, test system including the same, and manufacturing metho...
- Patent number 9,759,741
- Issue date Sep 12, 2017
- Samsung Electronics Co., Ltd.
- Sooyong Park
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE INCLUDING PRINTED CIRCUIT BOARD
- Publication number 20240080982
- Publication date Mar 7, 2024
- Samsung Electronics Co., Ltd.
- Juho Kim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST DEVICES, TEST SYSTEMS, AND OPERATING METHODS OF TEST SYSTEMS
- Publication number 20220178997
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- Ungjin JANG
- G11 - INFORMATION STORAGE
Information Patent Application
TEST INTERFACE BOARD AND SYSTEM INCLUDING THE SAME
- Publication number 20190164851
- Publication date May 30, 2019
- SAMSUNG ELECTRONICS CO., LTD.
- JONGWOON YOO
- G11 - INFORMATION STORAGE
Information Patent Application
IMPEDANCE MATCHING DEVICE FOR REDUCING REFLECTION LOSS BY SPLITTING...
- Publication number 20170133736
- Publication date May 11, 2017
- Samsung Electronics Co., Ltd.
- Jae Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD, TEST SYSTEM INCLUDING THE SAME, AND MANUFACTURING METHO...
- Publication number 20160091531
- Publication date Mar 31, 2016
- Sooyong PARK
- G01 - MEASURING TESTING