Sopa Chevacharoenkul

Person

Richardson, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Layouts for interlevel crack prevention in fluxgate technology manu...
- Patent number 12,105,161
- Issue date Oct 1, 2024
- Texas Instruments Incorporated
- Sudtida Lavangkul
- G01 - MEASURING TESTING
Information Patent Grant
Integrated fluxgate device
- Patent number 11,508,721
- Issue date Nov 22, 2022
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated trench capacitor with top plate having reduced voids
- Patent number 11,121,207
- Issue date Sep 14, 2021
- Texas Instruments Incorporated
- Binghua Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated fluxgate device
- Patent number 10,978,448
- Issue date Apr 13, 2021
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective patterning of titanium encapsulation layers
- Patent number 10,005,662
- Issue date Jun 26, 2018
- Texas Instruments Incorporated
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Selective patterning of an integrated fluxgate device
- Patent number 9,771,261
- Issue date Sep 26, 2017
- Texas Instruments Incorporated
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
In-situ doped polysilicon filler for trenches
- Patent number 9,691,751
- Issue date Jun 27, 2017
- Texas Instruments Incorporated
- Bhaskar Srinivasan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single step CMP for polishing three or more layer film stacks
- Patent number 8,334,190
- Issue date Dec 18, 2012
- Texas Instruments Incorporated
- Eugene C. Davis
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Forming integrated circuit devices with metal-insulator-metal capac...
- Patent number 8,110,414
- Issue date Feb 7, 2012
- Texas Instruments Incorporated
- Marshall O. Cathey, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufactured by reducing hillock formation in...
- Patent number 7,745,335
- Issue date Jun 29, 2010
- Texas Instruments Incorporated
- Ju-Ai Ruan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of punch-thru defects in damascene processing
- Patent number 7,727,885
- Issue date Jun 1, 2010
- Texas Instruments Incorporated
- Phillip Daniel Matz
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LAYOUTS FOR INTERLEVEL CRACK PREVENTION IN FLUXGATE TECHNOLOGY MANU...
- Publication number 20250020740
- Publication date Jan 16, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Sudtida Lavangkul
- G01 - MEASURING TESTING
Information Patent Application
Integrated Fluxgate Device
- Publication number 20210233903
- Publication date Jul 29, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. Eissa
- G01 - MEASURING TESTING
Information Patent Application
LAYOUTS FOR INTERLEVEL CRACK PREVENTION IN FLUXGATE TECHNOLOGY MANU...
- Publication number 20190331742
- Publication date Oct 31, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Sudtida Lavangkul
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TRENCH CAPACITOR WITH TOP PLATE HAVING REDUCED VOIDS
- Publication number 20180130869
- Publication date May 10, 2018
- TEXAS INSTRUMENTS INCORPORATED
- BINGHUA HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE PATTERNING OF TITANIUM ENCAPSULATION LAYERS
- Publication number 20170341934
- Publication date Nov 30, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Selective Patterning of an Integrated Fluxgate Device
- Publication number 20170267521
- Publication date Sep 21, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
LAYOUTS FOR INTERLEVEL CRACK PREVENTION IN FLUXGATE TECHNOLOGY MANU...
- Publication number 20170234942
- Publication date Aug 17, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Sudtida Lavangkul
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU DOPED THEN UNDOPED POLYSILICON FILLER FOR TRENCHES
- Publication number 20170221983
- Publication date Aug 3, 2017
- TEXAS INSTRUMENTS INCORPORATED
- BHASKAR SRINIVASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Fluxgate Device
- Publication number 20170213956
- Publication date Jul 27, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU DOPED POLYSILICON FILLER FOR TRENCHES
- Publication number 20160172235
- Publication date Jun 16, 2016
- TEXAS INSTRUMENTS INCORPORATED
- BHASKAR SRINIVASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE STEP CMP FOR POLISHING THREE OR MORE LAYER FILM STACKS
- Publication number 20110275168
- Publication date Nov 10, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Eugene C. Davis
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
SELECTIVE PLASMA ETCH OF TOP ELECTRODES FOR METAL-INSULATOR-METAL (...
- Publication number 20100276783
- Publication date Nov 4, 2010
- Texas Instruments Inc.
- MARSHALL O. CATHEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO PREVENT LOCALIZED ELECTRICAL OPEN CU LEADS IN VLSI CU INT...
- Publication number 20100120242
- Publication date May 13, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Sopa Chevacharoenkul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURED BY REDUCING HILLOCK FORMATION IN...
- Publication number 20080150131
- Publication date Jun 26, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Ju-Ai Ruan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reduction of punch-thru defects in damascene processing
- Publication number 20080057711
- Publication date Mar 6, 2008
- Texas Instrumentd incorporated
- Phillip Daniel Matz
- H01 - BASIC ELECTRIC ELEMENTS

Sopa Chevacharoenkul

Person

Patents Grantslast 30 patents

Layouts for interlevel crack prevention in fluxgate technology manu...

Integrated fluxgate device

Integrated trench capacitor with top plate having reduced voids

Integrated fluxgate device

Selective patterning of titanium encapsulation layers

Selective patterning of an integrated fluxgate device

In-situ doped polysilicon filler for trenches

Single step CMP for polishing three or more layer film stacks

Forming integrated circuit devices with metal-insulator-metal capac...

Semiconductor device manufactured by reducing hillock formation in...

Reduction of punch-thru defects in damascene processing

Patents Applicationslast 30 patents

LAYOUTS FOR INTERLEVEL CRACK PREVENTION IN FLUXGATE TECHNOLOGY MANU...

Integrated Fluxgate Device

LAYOUTS FOR INTERLEVEL CRACK PREVENTION IN FLUXGATE TECHNOLOGY MANU...

INTEGRATED TRENCH CAPACITOR WITH TOP PLATE HAVING REDUCED VOIDS

SELECTIVE PATTERNING OF TITANIUM ENCAPSULATION LAYERS

Selective Patterning of an Integrated Fluxgate Device

LAYOUTS FOR INTERLEVEL CRACK PREVENTION IN FLUXGATE TECHNOLOGY MANU...

IN-SITU DOPED THEN UNDOPED POLYSILICON FILLER FOR TRENCHES

Integrated Fluxgate Device

IN-SITU DOPED POLYSILICON FILLER FOR TRENCHES

SINGLE STEP CMP FOR POLISHING THREE OR MORE LAYER FILM STACKS

SELECTIVE PLASMA ETCH OF TOP ELECTRODES FOR METAL-INSULATOR-METAL (...

METHOD TO PREVENT LOCALIZED ELECTRICAL OPEN CU LEADS IN VLSI CU INT...

SEMICONDUCTOR DEVICE MANUFACTURED BY REDUCING HILLOCK FORMATION IN...

Reduction of punch-thru defects in damascene processing