Sorin Lazar

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Energy spectrometer with dynamic focus
- Patent number 12,100,585
- Issue date Sep 24, 2024
- FEI Company
- Arthur Reinout Hartong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
EELS detection technique in an electron microscope
- Patent number 10,832,901
- Issue date Nov 10, 2020
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectroscopy in a transmission charged-particle microscope
- Patent number 9,991,087
- Issue date Jun 5, 2018
- FEI Company
- Erwin Fernand de Jong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing spectroscopy in a transmission charged-particl...
- Patent number 9,524,851
- Issue date Dec 20, 2016
- FEI Company
- Erwin Fernand de Jong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample in a charged-particle microscope
- Patent number 9,312,098
- Issue date Apr 12, 2016
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous electron detection
- Patent number 8,859,966
- Issue date Oct 14, 2014
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contrast for scanning confocal electron microscope
- Patent number 8,405,027
- Issue date Mar 26, 2013
- FEI Company
- Sorin Lazar
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ENERGY SPECTROMETER WITH DYNAMIC FOCUS
- Publication number 20230005733
- Publication date Jan 5, 2023
- FEI Company
- Arthur Reinout HARTONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE
- Publication number 20190341243
- Publication date Nov 7, 2019
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICLE MICROSCOPE
- Publication number 20160086762
- Publication date Mar 24, 2016
- FEI Company
- Erwin Fernand de Jong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of performing spectroscopy in a Transmission Charged-Particl...
- Publication number 20160071689
- Publication date Mar 10, 2016
- FEI Company
- Erwin Fernand de Jong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE
- Publication number 20150243474
- Publication date Aug 27, 2015
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contrast for Scanning Confocal Electron Microscope
- Publication number 20120012747
- Publication date Jan 19, 2012
- FEI Company
- Sorin Lazar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simultaneous Electron Detection
- Publication number 20110278451
- Publication date Nov 17, 2011
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS

Sorin Lazar

Person

Patents Grantslast 30 patents

Energy spectrometer with dynamic focus

EELS detection technique in an electron microscope

Spectroscopy in a transmission charged-particle microscope

Method of performing spectroscopy in a transmission charged-particl...

Method of examining a sample in a charged-particle microscope

Simultaneous electron detection

Contrast for scanning confocal electron microscope

Patents Applicationslast 30 patents

ENERGY SPECTROMETER WITH DYNAMIC FOCUS

EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE

SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICLE MICROSCOPE

Method of performing spectroscopy in a Transmission Charged-Particl...

METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE

Contrast for Scanning Confocal Electron Microscope

Simultaneous Electron Detection