Souk KIM

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Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Vibration isolation table for semiconductor equipment and vibration...
- Patent number 12,110,938
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Hyunchul Kim
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Test apparatus and test method thereof
- Patent number 12,092,656
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Methods of manufacturing semiconductor device
- Patent number 11,181,831
- Issue date Nov 23, 2021
- Samsung Electronics Co., Ltd.
- Kyoung-hwan Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor pattern detecting apparatus
- Patent number 11,017,525
- Issue date May 25, 2021
- Samsung Electronics Co., Ltd.
- Jae Hyung Ahn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting semiconductor wafer, inspection system for per...
- Patent number 11,004,712
- Issue date May 11, 2021
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring method for semiconductor wafer including a plural...
- Patent number 10,410,937
- Issue date Sep 10, 2019
- Samsung Electronics Co., Ltd.
- Jang Ik Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting wafer using electron beam
- Patent number 10,373,796
- Issue date Aug 6, 2019
- Samsung Electronics Co., Ltd.
- Souk Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device using semiconductor...
- Patent number 9,583,402
- Issue date Feb 28, 2017
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for measuring thickness of thin film, system including th...
- Patent number 9,417,055
- Issue date Aug 16, 2016
- Samsung Electronics Co., Ltd.
- Sung-Yoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Image processing method and image processing apparatus using time a...
- Patent number 9,148,549
- Issue date Sep 29, 2015
- SNU PRECISION CO., LTD.
- Chang Kue Lim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
CRITICAL DIMENSION PREDICTION SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20240332093
- Publication date Oct 3, 2024
- Samsung Electronics Co., Ltd.
- In Seok PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF
- Publication number 20240248051
- Publication date Jul 25, 2024
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...
- Publication number 20230194567
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROSCOPIC DEVICE, SPECTROSCOPIC METHOD USING THE SAME, AND METH...
- Publication number 20230154804
- Publication date May 18, 2023
- Samsung Electronics Co., Ltd.
- Jaeho KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD O...
- Publication number 20230140892
- Publication date May 11, 2023
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIBRATION ISOLATION TABLE FOR SEMICONDUCTOR EQUIPMENT AND VIBRATION...
- Publication number 20230079008
- Publication date Mar 16, 2023
- Samsung Electronics Co., Ltd.
- Hyunchul Kim
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20220404395
- Publication date Dec 22, 2022
- Korea Advanced Institute of Science and Technology
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20200194317
- Publication date Jun 18, 2020
- Samsung Electronics Co., Ltd.
- Kyoung-hwan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PATTERN DETECTING APPARATUS
- Publication number 20200184618
- Publication date Jun 11, 2020
- Samsung Electronics Co., Ltd.
- Jae Hyung AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME
- Publication number 20200182783
- Publication date Jun 11, 2020
- Samsung Electronics Co., Ltd.
- Sunhong JUN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR WAFER, INSPECTION SYSTEM FOR PER...
- Publication number 20200176292
- Publication date Jun 4, 2020
- Samsung Electronics Co,Ltd.
- Sung Yoon RYU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MEASURING METHOD FOR SEMICONDUCTOR WAFER INCLUDING A PLURAL...
- Publication number 20190181062
- Publication date Jun 13, 2019
- Samsung Electronics Co., Ltd.
- Jang Ik PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Inspecting Wafer Using Electron Beam
- Publication number 20160293379
- Publication date Oct 6, 2016
- Samsung Electronics Co., Ltd.
- Souk Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MEASURING THICKNESS OF THIN FILM, SYSTEM INCLUDING TH...
- Publication number 20160061583
- Publication date Mar 3, 2016
- Samsung Electronics Co., Ltd.
- Sung-Yoon RYU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING SEMICONDUCTOR...
- Publication number 20160027707
- Publication date Jan 28, 2016
- Samsung Electronics Co., Ltd.
- Sung Yoon RYU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING METHOD AND IMAGE PROCESSING APPARATUS USING TIME A...
- Publication number 20140085454
- Publication date Mar 27, 2014
- UMECHA CO., LTD.
- Chang Kue LIM
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Vibration isolation table for semiconductor equipment and vibration...

Test apparatus and test method thereof

Methods of manufacturing semiconductor device

Semiconductor pattern detecting apparatus

Method of inspecting semiconductor wafer, inspection system for per...

Optical measuring method for semiconductor wafer including a plural...

Method of inspecting wafer using electron beam

Method of manufacturing a semiconductor device using semiconductor...

Apparatus for measuring thickness of thin film, system including th...

Image processing method and image processing apparatus using time a...

Patents Applicationslast 30 patents

CRITICAL DIMENSION PREDICTION SYSTEM AND OPERATION METHOD THEREOF

WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...

SPECTROSCOPIC DEVICE, SPECTROSCOPIC METHOD USING THE SAME, AND METH...

METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD O...

VIBRATION ISOLATION TABLE FOR SEMICONDUCTOR EQUIPMENT AND VIBRATION...

TEST APPARATUS AND TEST METHOD THEREOF

METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR PATTERN DETECTING APPARATUS

MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME

METHOD OF INSPECTING SEMICONDUCTOR WAFER, INSPECTION SYSTEM FOR PER...

OPTICAL MEASURING METHOD FOR SEMICONDUCTOR WAFER INCLUDING A PLURAL...

Method of Inspecting Wafer Using Electron Beam

APPARATUS FOR MEASURING THICKNESS OF THIN FILM, SYSTEM INCLUDING TH...

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING SEMICONDUCTOR...

IMAGE PROCESSING METHOD AND IMAGE PROCESSING APPARATUS USING TIME A...