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Sri Rama Prasanna Pavani
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Computational wafer image processing
Patent number
10,184,901
Issue date
Jan 22, 2019
Exnodes Inc.
Sri Rama Prasanna Pavani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Distributed wafer information processing
Patent number
10,082,533
Issue date
Sep 25, 2018
Exnodes Inc.
Sri Rama Prasanna Pavani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multiple camera computational wafer inspection
Patent number
10,027,928
Issue date
Jul 17, 2018
Exnodes Inc.
Sri Rama Prasanna Pavani
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Fabrication of lenses using high viscosity liquid
Patent number
9,851,475
Issue date
Dec 26, 2017
Ricoh Company, Ltd.
Sri Rama Prasanna Pavani
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Computational wafer inspection filter design
Patent number
9,696,265
Issue date
Jul 4, 2017
Exnodes Inc.
Sri Rama Prasanna Pavani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Distributed wafer inspection
Patent number
9,612,273
Issue date
Apr 4, 2017
Exnodes Inc.
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Grant
Lenticular wafer inspection
Patent number
9,523,645
Issue date
Dec 20, 2016
Exnodes Inc.
Sri Rama Prasanna Pavani
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Multiple angle computational wafer inspection
Patent number
9,395,309
Issue date
Jul 19, 2016
Exnodes Inc.
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Grant
High resolution imaging devices with wide field and extended focus
Patent number
9,357,202
Issue date
May 31, 2016
California Institute of Technology
Sri Rama Prasanna Pavani
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Certified wafer inspection
Patent number
9,324,541
Issue date
Apr 26, 2016
Exnodes Inc.
Sri Rama Prasanna Pavani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wide field illumination for wafer inspection
Patent number
9,250,194
Issue date
Feb 2, 2016
Exnodes Inc.
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Grant
Labeled wafer inspection
Patent number
9,250,187
Issue date
Feb 2, 2016
Exnodes Inc.
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Grant
Optical target detection
Patent number
9,245,445
Issue date
Jan 26, 2016
Ricoh Co., Ltd.
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Grant
Nondiffracting beam detection devices for three-dimensional imaging
Patent number
8,970,671
Issue date
Mar 3, 2015
California Institute of Technology
Sri Rama Prasanna Pavani
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Compact multi-aperture three-dimensional imaging system
Patent number
8,542,268
Issue date
Sep 24, 2013
Ricoh Co., Ltd.
Sri Rama Prasanna Pavani
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
COMPUTATIONAL WAFER IMAGE PROCESSING
Publication number
20170140517
Publication date
May 18, 2017
Exnodes Inc.
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Application
DISTRIBUTED WAFER INFORMATION PROCESSING
Publication number
20170046798
Publication date
Feb 16, 2017
Exnodes Inc.
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Application
DISTRIBUTED WAFER INFORMATION PROCESSING
Publication number
20160154052
Publication date
Jun 2, 2016
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Application
CERTIFIED WAFER INSPECTION
Publication number
20160141146
Publication date
May 19, 2016
Sri Rama Prasanna Pavani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPUTATIONAL WAFER IMAGE PROCESSING
Publication number
20160123897
Publication date
May 5, 2016
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE CAMERA WAFER INSPECTION
Publication number
20160116419
Publication date
Apr 28, 2016
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Application
LENTICULAR WAFER INSPECTION
Publication number
20160109376
Publication date
Apr 21, 2016
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE ANGLE COMPUTATIONAL WAFER INSPECTION
Publication number
20160109381
Publication date
Apr 21, 2016
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING
Information
Patent Application
Fabrication of Lenses Using High Viscosity Liquid
Publication number
20140153104
Publication date
Jun 5, 2014
Sri Rama Prasanna Pavani
G02 - OPTICS
Information
Patent Application
Optical Target Detection
Publication number
20130215218
Publication date
Aug 22, 2013
Sri Rama Prasanna Pavani
G01 - MEASURING TESTING