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Sribhaskar Mahadevan
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Chandler, AZ, US
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last 30 patents
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Patent Grant
Methods and apparatus for incorporating IDDQ testing into logic BIST
Patent number
7,272,767
Issue date
Sep 18, 2007
FREESCALE SEMICONDUCTOR, INC.
Tomas V. Colunga
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Methods and apparatus for incorporating IDDQ testing into logic BIST
Publication number
20060248424
Publication date
Nov 2, 2006
Tomas V. Colunga
G01 - MEASURING TESTING